Quantitative analysis method of xrf elements based on pca-svr

A PCA-SVR, quantitative analysis technology, applied in the analysis of materials, material analysis using wave/particle radiation, measurement devices, etc., can solve the problems of element spectral line peak count overlap, element information uncertainty, lack of data verification, etc. , to achieve the effect of intuitive results, rapid quantitative prediction, and high detection accuracy

Active Publication Date: 2022-06-03
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0003] The traditional method mainly uses XRF spectrometer to conduct accurate qualitative and quantitative analysis of trace elements, which is prone to problems such as peak count overlap between element spectral lines, uncertainty of element information, and high detection limit of elements. Under the situation that improves the accuracy of element quantitative analysis result, has become the focus of the present invention's research
Therefore, the principal component analysis-support vector regression (PCA-SVR) algorithm is applied to the quantitative analysis of elements, which solves the problems of inaccurate calculation and lack of data inspection of traditional X-ray fluorescence spectrometer, and aims to provide a basis for the quantitative analysis of X-ray fluorescence spectrometer results. An Alternative Test Method

Method used

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  • Quantitative analysis method of xrf elements based on pca-svr
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  • Quantitative analysis method of xrf elements based on pca-svr

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Embodiment Construction

[0045] The specific embodiments of the present invention and the working principle are described in further detail below in conjunction with the accompanying drawings.

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[0061] Step 4: XRF spectral data normalization. Convert matrix X of original size n×m

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[0075] In the formula, i=1,2,...,n, j=1,2,...,m, is the row vector of the i-th row in the standardized matrix.

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[0079] Step 9: In order to control the calculation speed and reduce the error in the sample training, a penalty factor C and relaxation are introduced

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[0082] Step 10: Use the grid search-based cross-validation method to optimize parameters, and train the PCA-SVR model. pass

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[0094] The traditional Partial Least Squares Regression (PLSR) method and the standard soil based on the PCA-SVR method of the present invention will be used

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[0098] The ab...

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Abstract

The invention discloses an XRF element quantitative analysis method based on PCA-SVR. The method includes reading element peak information and content information; determining the input and output of the PCA-SVR model; calculating correlation coefficients and unit eigenvectors; and calculating principal components; Construct a classification hyperplane, transform the optimal classification hyperplane problem into a quadratic programming model; train the PCA-SVR model through parameter optimization, and quantitatively predict the element content; select the optimal number of principal components; calculate the coefficient of determination, and evaluate PCA-SVR Model predictions. The invention has a simple operation process, scientific and reasonable, simple process, easy operation, high prediction accuracy, intuitive results, easy to understand, can solve the problems of X-ray fluorescence energy spectrum peak overlap interference, and inaccurate measurement methods of traditional instruments, etc., and reduces environmental problems. The influence of the background reduces the error caused by statistical fluctuations, and can effectively and quickly make quantitative predictions on the elements contained in the analyte.

Description

XRF element quantitative analysis method based on PCA‑SVR technical field The present invention relates to element detection field, particularly a kind of XRF element quantitative analysis method based on PCA-SVR. Background technique [0002] With the gradual development of energy spectrum scientific research, online qualitative and quantitative detection technology has become a new development trend. through After more than ten years of perfect and extended research, the use of X-ray fluorescence (XRF) spectroscopy to analyze elemental content has become a new type of This method is widely used in metallurgy, building materials, geology and mining, commodity inspection, environmental protection, food hygiene, non-ferrous metals, etc. field. The method has the advantages of rapid analysis, no damage to sample properties, wide analysis range, stable and reliable results, and rapid realization of multiple Simultaneous analysis of elements and ease of operation are man...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223G06K9/62G06V10/77G06V10/764
CPCG01N23/223G06F18/2135G06F18/2411
Inventor 杨婉琪李福生赵彦春
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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