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Automatic impedance test system and method

A technology of impedance test and impedance tester, which is applied in the direction of measuring resistance/reactance/impedance, measuring devices, measuring electrical variables, etc., can solve the problems of poor static impedance test accuracy and low test efficiency, and achieve poor test accuracy and reduce The effect of man-made operation risk and improving the accuracy of impedance test

Active Publication Date: 2022-01-07
XIAN MICROELECTRONICS TECH INST
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Problems solved by technology

[0003] In order to solve the problems existing in the prior art, the present invention provides an automated impedance testing system and method, which are used to solve the problems of poor static impedance testing accuracy and low testing efficiency of existing spaceborne products

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  • Automatic impedance test system and method

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Embodiment

[0039] figure 1 The principle block diagram of the self-correcting and expandable automatic impedance testing system proposed by the present invention includes a host, an impedance tester, a compensation and correction circuit, an expandable switch matrix and a display device.

[0040] The switch matrix can be set to open or close any channel switch through a visual software interface, and can also be controlled by a program. When testing the impedance between two points, you only need to close the switches corresponding to the two points, and the signals of these two points can be transmitted to the impedance tester;

[0041] The impedance tester adopts the two-wire impedance test method, connect the two channels gated by the switch matrix to the red and black test points of the impedance tester, and the impedance tester will automatically match a reasonable range and perform the test, and Pass the test results to the host through the RS232 serial port;

[0042] The compensat...

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Abstract

The invention discloses an automatic impedance test system and method. The automatic impedance test system comprises a host, an impedance tester, a compensation correction circuit and a switch matrix; the switch matrix is arranged on a long-line test cable; the long-line test cable is connected with the input end of the impedance tester, the output end of the impedance tester is connected with the host, the impedance tester is used for automatically testing the impedance of a gated channel, and the compensation calibration circuit is used for eliminating the impedance introduced by the long-line test cable and the switch matrix; and the output end of the compensation correction circuit is connected with the input end of the host, and the host is used for correcting data measured by the impedance test circuit according to data obtained by the compensation correction circuit, comparing the corrected data with a preset impedance criterion and storing the data. According to the invention, the problems of poor static impedance test precision and low test efficiency of an existing satellite-borne product are solved, the test time is saved, the development period is shortened, the cost is reduced, the test precision is improved, and the safety and reliability of the product are enhanced.

Description

technical field [0001] The invention belongs to the technical field of electronic testing, in particular to an automatic impedance testing system and method. Background technique [0002] At present, the impedance test of satellite-borne computer products is mainly through manual measurement after cable transfer, and the measurement results need to be recorded manually, which has the disadvantages of low efficiency and unsafety; the signal on the external connector often adopts a double-point design, The impedance between two points is required to be less than 0.1Ω. In the existing test process, the test cable is usually long. Due to the influence of the internal resistance of the test cable, the accuracy of the impedance test result is not high. Sometimes the impedance between two points is greater than 0.1Ω, so the impedance test accuracy is higher. In some occasions, the influence of the impedance introduced by the test cable itself on the accuracy can no longer be ignor...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02G01R15/00G01R35/00
CPCG01R27/02G01R15/00G01R35/005
Inventor 全勇涛贾森路海全王强何海峰刘曙蓉李鹏杨文清王晨阳
Owner XIAN MICROELECTRONICS TECH INST
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