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Hardware-in-the-loop rack, diagnostic test method and diagnostic test system

A hardware-in-the-loop technology, applied in the field of hardware-in-the-loop, diagnostic test methods and diagnostic test systems, can solve the problems of unrealized automation functions of hardware unified diagnostic service testing, and achieve improved test efficiency, low cost, and flexibility The effect of the test

Pending Publication Date: 2022-01-07
SHANGHAI CHONGSU ENERGY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a hardware-in-the-loop platform, a diagnostic testing method and a diagnostic testing system, which are used to solve the problem of unrealized unified diagnostic services of the hardware-in-the-loop platform in the prior art. The problem with the automation function of the test

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  • Hardware-in-the-loop rack, diagnostic test method and diagnostic test system
  • Hardware-in-the-loop rack, diagnostic test method and diagnostic test system
  • Hardware-in-the-loop rack, diagnostic test method and diagnostic test system

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Embodiment Construction

[0031] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that, in the case of no conflict, the following embodiments and features in the embodiments can be combined with each other.

[0032] It should be noted that the diagrams provided in the following embodiments are only schematically illustrating the basic ideas of the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the compo...

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Abstract

The invention provides a hardware-in-the-loop rack, a diagnostic test method and a diagnostic test system. The hardware-in-the-loop rack comprises a real-time processor and a controller local area network board card, a hardware-in-the-loop simulation model runs in the real-time processor; the hardware-in-the-loop simulation model comprises a unified diagnosis service application layer model, a transmission layer model and a controller local area network communication model; the unified diagnosis service application layer model comprises a sending signal processing module and a receiving signal analysis module; and the controller local area network board card is used for completing the function of the controller local area network communication model. According to the hardware-in-the-loop rack, the diagnostic test method and the diagnostic test system, an automatic unified diagnostic service test function can be realized without an external diagnostic instrument; the cost is low, the test system is high in integration degree, and rapid and flexible testing is facilitated; therefore, the unified diagnosis service testing efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of controller diagnostic testing, in particular to a hardware-in-the-loop platform, a diagnostic testing method and a diagnostic testing system. Background technique [0002] Hardware-in-the-Loop (HIL) is connected to the controller through the input and output interface, and runs the simulation model based on the real-time processor to simulate the controlled object under the control of the controller in extreme working conditions or dangerous working conditions. The running state in the situation scenario, so as to realize the diagnostic test of the controller to the controlled object when a fault occurs in the above scenario. The fault diagnosis test includes verifying the fault action of the controller and the unified diagnosis service test, such as reading fault codes and snapshot information. Wait. [0003] The unified diagnostic service test in the fault diagnosis test of the hardware-in-the-loop ben...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F11/26
CPCG06F11/2205G06F11/261G06F11/2273
Inventor 凌俊威孟健李宁付逢春
Owner SHANGHAI CHONGSU ENERGY TECH CO LTD
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