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Composite surface type X-ray piezoelectric deformable mirror

An X-ray and deformable mirror technology, applied in the field of X-ray optical wavefront correction, can solve the problems of difficult adjustment and high cost, and achieve the effect of increasing the application range

Pending Publication Date: 2022-01-25
SHANGHAI ADVANCED RES INST CHINESE ACADEMY OF SCI
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage of the current existing technology is that it only provides single-chip piezoelectric ceramic arrangement and driving methods, and does not apply the advantages of this piezoelectric deformation technology to the design of complex optical systems
[0005] Therefore, a new technology is needed to overcome the huge difficulties in the processing and assembly of various traditional fixed surface type such as Wolter type or LobsterEye type grazing incidence reflective elements, avoiding the need for multiple groups of mirrors to form the focusing lens, which is difficult to adjust , and costly defects

Method used

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  • Composite surface type X-ray piezoelectric deformable mirror
  • Composite surface type X-ray piezoelectric deformable mirror
  • Composite surface type X-ray piezoelectric deformable mirror

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Embodiment Construction

[0029] like Figure 2A-Figure 2B The X-ray piezoelectric definition mirror of a composite face type according to an embodiment of the present invention is shown. The X-ray piezoelectric deformed mirror is a mirror, and its substrate surface is a rectangular shape, or is designed as a special shape to compensate for a surface distortion caused by a pressure.

[0030] The X-ray piezoelectric definitive mirror includes a substrate 11 (i.e., a mirror substrate) and an optical reflection film 12 disposed above the substrate 11, according to the requirements of the composite surface, the upper surface of the optical reflection film 12 is divided into Two mirrors (ie, two optical surfaces). In the present embodiment, the optical reflection film 12 is disposed above the center position above the substrate 11. Among them, at least one of the upper surfaces, the lower surface, and the side surface of the substrate 11 is provided with a piezoelectric ceramic sheet such that the two mirror sur...

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Abstract

The invention provides a composite surface type X-ray piezoelectric deformable mirror, which comprises a substrate and an optical reflecting film arranged above the substrate, wherein the upper surface of the optical reflecting film is divided into two mirror surfaces, and at least two types of piezoelectric ceramic sheets are arranged on at least one of the upper surface, the lower surface and the side surface of the substrate, so that the two mirror surfaces are respectively driven by the piezoelectric ceramic sheets to generate two required different surface types. According to the composite surface type X-ray piezoelectric deformable mirror disclosed by the invention, an active optical technology based on piezoelectric driving and a multi-surface type combined grazing incidence X-ray reflecting mirror system are integrated, and when an applied voltage is parallel to the electric polarization direction of each piezoelectric ceramic sheet, the piezoelectric stretching in the transverse direction of the piezoelectric ceramic sheet can drive the stretching of the optical substrate with the thickness changing along with the mirror length to generate local curvature needed in the meridian direction of the mirror length, so that the defect that the surface shape of the reflecting mirror is difficult to adjust is overcome; and finally, through the combination of the two surface types, an aberration-free focusing effect is realized, so that full-field imaging and focusing are realized.

Description

Technical field [0001] The present invention belongs to the active X-ray optical wave pre-correction, and specifically, a composite face type X-ray piezoelectric definition mirror, which is used to heat the focus of X-rays to achieve reduced aberration, regulatory focus spot and position. Role. Background technique [0002] In a hard X-ray band, the refractive index of any material is close to 1. Therefore, a higher reflectivity can only be obtained when the plunder is hierarchical. Therefore, the reflective reflective element that is incident is a major form of hard X-ray imaging and focusing. Common bridging reflection focusing element types include Kirkpatrick-Baez, Wolter I, II, III and LobStereye type, where the first two types are most widely used in the field of synchronous radiation microscopy and space telescope. In 1952, Wolter proposed a rotating cone surface that uses two coaxial CAFE constitutes an optical system, including three types of Wolter I, II, III, mainly ex...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G21K1/06
CPCG21K1/067
Inventor 蒋晖田纳玺
Owner SHANGHAI ADVANCED RES INST CHINESE ACADEMY OF SCI
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