Speckle pattern-based mirror surface object three-dimensional measurement method

A technology of three-dimensional measurement and speckle pattern, which is applied to measuring devices, instruments, optical devices, etc., to avoid error accumulation, reduce subset size, and improve measurement efficiency

Pending Publication Date: 2022-02-08
NANCHANG HANGKONG UNIVERSITY
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  • Application Information

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Problems solved by technology

Due to the reflective characteristics of mirror or mirror-like objects, the traditional three-dimensional surface shape detection cannot meet the requ

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  • Speckle pattern-based mirror surface object three-dimensional measurement method
  • Speckle pattern-based mirror surface object three-dimensional measurement method
  • Speckle pattern-based mirror surface object three-dimensional measurement method

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[0018] The examples of the present invention will be described in further detail below with reference to the accompanying drawings, but the present invention is not intended to limit the invention.

[0019] A three-dimensional measurement method based on speckle pattern, principle, such as figure 1 As shown, including the acquisition device CCD camera, projection device LCD, reference mirror, to be tested mirror, computer. Firstly, a pre-designed speckle pattern is first generated, and then the speckle pattern is projected onto the reference mirror and the spectroscope to be tested. After the specular reflection, the reflection is collected by the CCD camera; Precision flat mount mobile projection device LCD, repeat the above operation; the projection device LCD is placed in two different locations, the screen of the projection device LCD is parallel to the reference mirror; at this time, the computer accepts four speckle patterns. After processing, the three-dimensional shape of ...

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Abstract

The invention discloses a speckle pattern-based mirror surface object three-dimensional measurement method, which comprises the following steps of firstly, generating a speckle pattern by using a computer, respectively projecting the speckle pattern on a reference mirror surface and a measured mirror surface by using an LCD screen, respectively acquiring by using an imaging system, and calculating the displacement of speckles by using an open-source 2D DIC application program Ncorr, acquiring the height of the measured mirror surface by directly establishing the relation between the speckle displacement and the height, and recovering the three-dimensional shape. Compared with a traditional sine fringe measurement method, the method has the advantages that patterns needing to be shot are greatly reduced, and the measurement efficiency is improved; by establishing the direct relation between the speckle displacement and the height, the gradient integration process is omitted, error accumulation in the gradient integration process is avoided, and the defect that a traditional method cannot measure discontinuous mirror objects is overcome; the method is simple in calculation, flexible in control and simple and convenient to operate, has high robustness in measurement of mirror objects, and has potential application prospect and practical value in precision measurement.

Description

technical field [0001] The invention relates to an optical three-dimensional measurement method, which belongs to the technical field of photoelectric detection, and in particular to a three-dimensional measurement method of a specular object based on a speckle pattern. Background technique [0002] With the advancement of science and technology and the development of the precision manufacturing industry, the traditional one-dimensional and two-dimensional measurement technology has been unable to adapt to the modern industrial process. How to quickly and accurately obtain the three-dimensional shape of products with high precision requirements has gradually become a hot spot of concern. Optical 3D measurement technology has been widely used in reverse engineering, industrial inspection, virtual reality, medical engineering, cultural relics protection and other fields due to its characteristics of fast acquisition, non-contact operation, full-field measurement and fast data ...

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Application Information

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IPC IPC(8): G01B11/25G01B11/06
CPCG01B11/254G01B11/0608
Inventor 伏燕军杨文强刘志晗钟汇凯钟可君
Owner NANCHANG HANGKONG UNIVERSITY
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