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Young modulus tester

A technology of Young's modulus and tester, which is applied in the direction of instruments, measuring devices, scientific instruments, etc., can solve the problems of high cost and complex structure, and achieve the effects of low cost, simplified operation steps, and simple structure

Pending Publication Date: 2022-02-08
WUHAN INSTITUTE OF TECHNOLOGY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to provide a Young's modulus tester to solve the problems of complex structure and high cost of the traditional Young's modulus tester

Method used

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Embodiment Construction

[0017] In order to make the purpose, technical solutions and advantages of the embodiments of the present disclosure clearer, the technical solutions of the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present disclosure. Apparently, the described embodiments are some of the embodiments of the present disclosure, not all of them. Based on the described embodiments of the present disclosure, all other embodiments obtained by persons of ordinary skill in the art without creative effort fall within the protection scope of the present disclosure.

[0018] see figure 1 , figure 2 , a Young's modulus tester, comprising a frame 1, two wire fastening devices 3 are arranged on the upper part of the frame 1, and the two wire fastening devices 3 are respectively fixed with wires 2 having the same specification, material and length, The upper ends of the two metal wires 2 are...

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Abstract

The invention discloses a Young modulus tester. The tester comprises a frame, two metal wire fastening devices are arranged on the upper portion of the frame, metal wires with the same specification, material and length are fixed to the two metal wire fastening devices respectively, and precision resistors with the same resistance value are connected to the upper ends of the two metal wires respectively. Identical weight trays are hung below the two metal wires; the connected metal wire and precision resistor are connected in parallel to form a variable resistance circuit; two ends of the variable resistance circuit are connected with a voltage source; the two metal wires are respectively connected in parallel with two input ends of a differential amplification circuit, and the output end of the differential amplification circuit is connected with the input end of the voltage acquisition module. The Young modulus is measured by using a resistance comparison amplification method, and the method has the advantages of novel method, simple device structure and low cost.

Description

technical field [0001] The invention relates to the field of test equipment, in particular to a Young's modulus tester. Background technique [0002] The traditional Young's modulus measurement experiment uses the optical lever method. Its principle is to amplify the small displacement generated by the external force through the optical lever, so as to measure the Young's modulus. Such an experimental device is relatively expensive to manufacture, complicated to maintain, and easily damaged. Contents of the invention [0003] The purpose of the present invention is to provide a Young's modulus tester to solve the problems of complex structure and high cost of the traditional Young's modulus tester. [0004] In order to achieve the above object, the present invention provides a technical solution: the Young's modulus tester includes a frame, two wire fastening devices are arranged on the upper part of the frame, and the two wire fastening devices are respectively fixed wit...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/14G01N3/06
CPCG01N3/14G01N3/066G01N2203/0075G01N2203/0676G01N2203/0682
Inventor 张昱李绍寅胡博刘文烁陈国攀杨晗符海西徐志坚钟馨王若玉
Owner WUHAN INSTITUTE OF TECHNOLOGY
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