Over-current protection circuit for IGBT dynamic test and IGBT dynamic test system

A technology for protecting circuits and dynamic testing, applied in overload protection devices, bipolar transistor testing, single semiconductor device testing, etc.

Pending Publication Date: 2022-02-08
ZHUZHOU CRRC TIMES SEMICON CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The technical problem to be solved by the present invention is to provide an overcurrent protection circuit for IGBT dynamic testing and an IGBT dynamic testing system to solve the problem that a failure overcurrent in the IGBT dynamic testing system causes a great impact on the entire testing system

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  • Over-current protection circuit for IGBT dynamic test and IGBT dynamic test system
  • Over-current protection circuit for IGBT dynamic test and IGBT dynamic test system
  • Over-current protection circuit for IGBT dynamic test and IGBT dynamic test system

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Embodiment Construction

[0022] In order to make the purpose, technical solutions and advantages of the present disclosure clearer, the present disclosure will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0023] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in one or more embodiments of the present invention shall have the usual meanings understood by those skilled in the art to which the present disclosure belongs. "First", "second" and similar terms used in one or more embodiments of the present invention do not indicate any order, quantity or importance, but are used to distinguish different components. "Comprising" or "comprising" and similar words mean that the elements or items appearing before the word include the elements or items listed after the word and their equivalents, without excluding other elements or items. Words such as "connected" or "connected" are ...

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Abstract

One or more embodiments of the invention provide an over-current protection circuit for an IGBT dynamic test and an IGBT dynamic test system. The over-current protection circuit comprises a protection switch and a control circuit; the control circuit is connected with the first end, the second end and the third end of the protection switch, the second end of the protection switch is connected with a power supply circuit, and the third end of the protection switch is connected with an IGBT dynamic test loop; when a tested IGBT in the IGBT dynamic test loop fails and is short-circuited, the control circuit detects a first voltage between the second end and the third end of the protection switch, and turns off the protection switch and cuts off the direct-through discharge channel of the power supply circuit when the first voltage exceeds a preset reference voltage. The over-current protection circuit can effectively limit the loop current when the IGBT dynamic test system has failure overcurrent, protects the whole system from being impacted by large current, and is simple in structure, rapid and reliable.

Description

technical field [0001] The invention belongs to the technical field of electronic device testing, and in particular relates to an overcurrent protection circuit for IGBT dynamic testing and an IGBT dynamic testing system. Background technique [0002] In an insulated gate bipolar transistor (Insulated Gate Bipolar Transistor, IGBT) dynamic test system, there is usually a large-capacity support capacitor for energy storage. When the IGBT under test fails, it will cause the capacitor to discharge directly, and the energy of the large-capacity capacitor will pass the test. The instantaneous release of the loop will cause a great impact on the entire test system. If the protection is not proper, it will speed up the aging process of the equipment, increase the failure rate of the equipment, and seriously paralyze the entire test system. Therefore, it is very important to detect the loop overcurrent in a short time and shut down the large current in time. Contents of the invent...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R1/36
CPCG01R31/2608G01R1/36
Inventor 袁涛余伟史慧敏孙波艳郑宇熊强谭旻凌浪波刘敏安任亚东罗海辉
Owner ZHUZHOU CRRC TIMES SEMICON CO LTD
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