Silicon controlled rectifier detector and silicon controlled rectifier performance detection method
A technology of detectors and silicon controlled rectifiers, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problem of extensive measurement mode, inability to effectively measure the precise characteristics of silicon controlled silicon triggering and shutting down, and inability to intuitively judge the performance of silicon controlled silicon and other issues to achieve the effect of improving accuracy
Pending Publication Date: 2022-02-15
SIEMENS FACTORY AUTOMATION ENG
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Problems solved by technology
[0002] A large number of silicon controlled rectifiers are used in inverters, DC speed controllers and other equipment, but at present, the performance testing of silicon controlled rectifiers generally adopts withstand voltage test methods or small signal test methods, and there is no effective judgment standard for withstand voltage test methods , and cannot intuitively judge the performance of the thyristor
However, the measurement mode of the small-signal test method is relatively extensive, and it cannot effectively measure the precise characteristics of the thyristor trigger shutdown
Therefore, there is currently no accurate SCR performance testing scheme.
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[0017] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work belong to the protection of the present invention. scope.
[0018] In one embodiment of the present invention, a thyristor detector is provided, such as figure 1 As shown, the detector includes: a power supply module 100, a phase angle selection module 200, a trigger signal generation module 300 and a signal detection module 400;
[0019] The power module 100 is used to output an AC voltage signal;
[0020] Th...
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The invention provides a silicon controlled rectifier detector. The silicon controlled rectifier detector comprises a power supply module, a phase angle selection module, a trigger signal generation module and a signal detection module; the power supply module is used for outputting AC voltage signals; the phase angle selection module is used for carrying out missing processing on the AC voltage signal according to a trigger phase angle set by personnel, so that a sinusoidal waveform corresponding to the AC voltage signal is missed, and the phase angle corresponding to the missed part is the same as the trigger phase angle; the trigger signal generation module is used for converting the alternating-current voltage signal after missing processing into a corresponding square wave trigger signal and loading the square wave trigger signal to a control electrode of the silicon controlled rectifier to be tested; and the power supply module is also used for applying AC voltage signal to positive and negative electrodes of the silicon controlled rectifier to be tested, and the signal detection module is used for detecting a circuit signal in a loop formed by the positive electrode and the negative electrode of the silicon controlled rectifier to be tested and the power supply module. The accuracy of silicon controlled rectifier performance detection is improved.
Description
technical field [0001] The invention relates to the technical field of silicon controlled rectifiers, in particular to a silicon controlled silicon detector and a silicon controlled silicon performance detection method. Background technique [0002] A large number of silicon controlled rectifiers are used in inverters, DC speed controllers and other equipment, but at present, the performance testing of silicon controlled rectifiers generally adopts withstand voltage test methods or small signal test methods, and there is no effective judgment standard for withstand voltage test methods , It is also impossible to judge the performance of the thyristor intuitively. However, the measurement mode of the small-signal test method is relatively extensive, and it cannot effectively measure the precise characteristics of the SCR trigger shutdown. So there is no accurate SCR performance testing scheme at present. Contents of the invention [0003] The invention provides a thyristo...
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Login to View More IPC IPC(8): G01R31/26G01R31/327
CPCG01R31/2601G01R31/2648G01R31/327
Inventor 孟轩金勇范
Owner SIEMENS FACTORY AUTOMATION ENG