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High-precision micro-curved-surface complex beam optical detection method and system

A technology of optical detection and multiple beams, which is applied in image data processing, instruments, calculations, etc., can solve problems such as the inability to balance detection efficiency and detection accuracy, and achieve the effects of improving data accuracy, low cost, and high efficiency

Pending Publication Date: 2022-02-15
GUANGDONG UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the defect that the above-mentioned prior art cannot take into account both detection efficiency and detection accuracy, the present invention provides a high-precision micro-curved surface complex beam optical detection method and system, which can quickly and non-contact detect the curved surface information of the measured object, and the steps are simple , the detection process is automated, the detection efficiency is high, and the detection results are accurate

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  • High-precision micro-curved-surface complex beam optical detection method and system
  • High-precision micro-curved-surface complex beam optical detection method and system
  • High-precision micro-curved-surface complex beam optical detection method and system

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Embodiment 1

[0077] This embodiment provides a high-precision micro-curved surface complex beam optical detection method, such as figure 1 shown, including:

[0078] S1: emit a light beam to the object under test, and collect the beam reflection image during the rotation of the object under test;

[0079] S2: Preprocessing the beam reflection image to obtain a preprocessed image;

[0080] S3: Obtain the rotation direction of the measured object according to the preprocessed image;

[0081] S4: Calculate the surface normal vector of the measured object according to the preprocessed image and the rotation direction, and obtain the RGB image of the surface normal vector of the measured object;

[0082] S5: Process the surface normal vector RGB image to obtain the processed surface normal vector;

[0083] S6: Calculate the depth value of each point on the measured object according to the processed surface normal vector to form a depth map of the measured object;

[0084] S7: Reconstruct th...

Embodiment 2

[0087] This embodiment provides a high-precision micro-curved surface complex beam optical detection method, including:

[0088] S1: emit a light beam to the object under test, and collect the beam reflection image during the rotation of the object under test;

[0089] A fixed-position complex beam angle sensor is used to emit light beams to the measured object, and a fixed-position CMOS camera is used to capture the reflected image of the light beam during the rotation process of the measured object. Such as figure 2 Shown are the beam reflection images of the measured object rotated to different directions and angles.

[0090] When the traditional method collects the light beam reflection image of the measured object, it is necessary to use the light source to emit light beams from different directions to illuminate the measured object, and it is necessary to use the calibration sphere to calculate the approximate direction of the light source illumination, and then place ...

Embodiment 3

[0128] This embodiment provides a high-precision micro-curved surface complex beam optical detection system, such as Figure 9 shown, including:

[0129] An image acquisition module, configured to emit a light beam to the measured object, and collect the reflected image of the light beam during the rotation of the measured object;

[0130] The image preprocessing module is used to preprocess the light beam reflection image to obtain the preprocessed image;

[0131] The rotation direction calculation module obtains the rotation direction of the measured object according to the preprocessed image;

[0132] The normal vector calculation module calculates the surface normal vector of the measured object according to the preprocessed image and the rotation direction, and obtains the surface normal vector RGB image of the measured object;

[0133] The RGB image processing module processes the surface normal vector RGB image to obtain the processed surface normal vector;

[0134] ...

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Abstract

The invention discloses a high-precision micro-curved-surface complex beam optical detection method and system, and relates to the technical field of precision engineering metrology, and the method comprises the steps: transmitting a light beam to a measured object, and collecting a light beam reflection image in the rotation process of the measured object; preprocessing the light beam reflection image to obtain a preprocessed image; obtaining the rotation direction of the measured object according to the pre-processed image; calculating a surface normal vector of the measured object according to the preprocessed image and the rotation direction, and obtaining a surface normal vector RGB image of the measured object; processing the surface normal vector RGB image to obtain a processed surface normal vector; calculating the depth value of each point on the measured object according to the processed surface normal vector, and forming a depth map of the measured object; and reconstructing a curved surface model of the measured object according to the depth map. The method and system can quickly detect the curved surface information of the detected object in a non-contact manner, and have the advantages of simple steps, automatic detection process, high detection efficiency and accurate detection result.

Description

technical field [0001] The invention relates to the technical field of precision engineering measurement, and more specifically, to a high-precision micro-curved surface complex beam optical detection method and system. Background technique [0002] In recent years, the ultra-precision processing technology of industrial components has been widely used in high-tech fields such as aerospace, national defense, biomedicine, communication, and microelectronics, and has become a key component in the optoelectronic and communication industries. A variety of application requirements also put forward higher requirements for the surface shape accuracy of parts. Accurately measuring the surface topography of curved surface parts can not only correctly identify changes and defects in the processing process, but also play a role in controlling and improving processing methods, studying the relationship between surface geometric characteristics and performance, and improving the quality ...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T5/00G06T5/20
CPCG06T7/0002G06T5/20G06T2207/10028G06T2207/20032G06T5/70
Inventor 蔡念周广何兆泉陈梅云王晗
Owner GUANGDONG UNIV OF TECH