Method and system for thin layer depiction

Abstract

The invention provides a method and system for thin layer depiction, and the method comprises the steps: obtaining a research distinguishing angle superposition data body, and obtaining a background longitudinal and transverse wave speed ratio of a research region through pre-stack inversion; obtaining an objective function used for representing the relation between zero offset data and actually measured seismic data, wherein the offset data is a longitudinal wave impedance reflectivity convolution wavelet result; performing inversion processing on the angle-divided superposition data volume by using the obtained objective function to obtain real zero-offset seismic reflection data of the research area; on the basis of obtaining real zero-offset reflection data obtained based on inversion, obtaining an odd-even component weight coefficient of the zero-offset reflection data, and on the basis, obtaining the zero-offset reflection data after the resolution is improved. According to the method, zero offset information is obtained through a step-by-step method, odd-even component decomposition is carried out on the basis of the zero offset information, the longitudinal resolution of reflection data is improved, and the whole process is more stable compared with multi-angle data superposition direct inversion.

Description

technical field [0001] The present invention relates to the technical field of seismic exploration and processing, in particular to a method and system for thin layer description. Background technique [0002] In conventional processing, in order to improve the signal-to-noise ratio of seismic data, the seismic data acquired by multiple coverage techniques are often superimposed, and the superimposed data is used as the actual self-excited and self-collected data, that is, zero-offset data (Mu Yongguang et al., Seismic Data Processing Methods, 2006). In the face of actual seismic data, the resolution of stacked data is often reduced due to inaccurate dynamic calibration velocity. Even if the dynamic calibration is completely accurate, there are obvious differences in seismic data with different offsets (Z.Sun, Y.Zhang and C.Fan, An iterative AVO inversion workflow for pure P-wave computation and S-wave improvement. The First Break, 2014, 10(32):47-50). The seismic data obt...

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Problems solved by technology

Conventional methods to improve inversion resolution are mainly divided into two types. The first one is the inversion method through stochastic simulation, but this method has extremely high requirements on the degree of well-seismic matching and the quantity and quality of well data. Time-consuming and poor applicability; the second method is based on the deterministic inversion method, which uses the odd-even decomposition of reflection coefficients to improve the longitudinal resolution. At present, this method is often based on stacked reflection data (Yin Xingyao et al. Inversion method. Petroleum Geophysical Exploration, 2019, 55(1):115-122) or use multi-angle stacked data to perform inversion calculation directly. The former is limited by the inherent problems of the stacked data, and the latter is limited by the condition number of the Jacobian matrix. Too large, the inversion process is more ill-posed

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