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Sectional calibration method for successive approximation analog-to-digital converter

A technology of analog-to-digital converter and calibration method, which is applied in the direction of analog/digital conversion calibration/test, analog/digital conversion, code conversion, etc., and can solve problems such as system deviation, random deviation, and influence on SARADC accuracy and linearity

Pending Publication Date: 2022-03-11
BEIJING UNIV OF TECH
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AI Technical Summary

Problems solved by technology

Due to the uncertainty of the manufacturing process, it will cause systematic deviation and random deviation, which directly affects the accuracy and linearity of SARADC

Method used

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  • Sectional calibration method for successive approximation analog-to-digital converter
  • Sectional calibration method for successive approximation analog-to-digital converter
  • Sectional calibration method for successive approximation analog-to-digital converter

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Embodiment Construction

[0039] By the following Figure 1 ~ 4 The present invention is further described.

[0040] Such as figure 1 As shown, ADC A is SARADC to be calibrated, and ADC B is an unsatched SAR ADC, and A and B are independent of each other. Using a linear system overlapping principle, it is known that if SaraDC is linear, the stacked disturbance signal superposed in an analog input signal is accurately compensated in the digital domain. Therefore, when power is modeled, the disturbance signal ± ± ΔA of the same analog input superposition, the symbol is opposite, and the two different ADCs are sampled and quantified. At the end of the SARADC conversion, the value of the input signal can be expressed as

[0041]

[0042]

[0043] Central B A And B B Two groups of N digits to be processed for SARADC, B A Results for VIN + ΔA conversion, B B The result of conversion for VIN-ΔA. N is the total number of active bits, and m is the number of data bits of the low code segment. W i The weight coeff...

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Abstract

The invention discloses a sectional calibration method for a successive approximation analog-to-digital converter. The successive approximation analog-to-digital converter for realizing the method comprises two N-bit SARADCs which are independent from each other and have deviation and two groups of digital calibration modules. Redundancy is introduced into two independent N-bit SARADC capacitor array structures, and back-end processing is carried out segment by segment through a digital method by using the redundancy, so that the ADC precision is improved. The digital calibration module realizes an LMS algorithm through a digital circuit so as to achieve a calibration purpose. The calibration algorithm is continuously carried out in the background, and normal work of the foreground is not affected. Compared with the existing calibration design, the segmented calibration algorithm uses two groups of different iteration steps, the configuration of two different iteration strategies is more flexible to adjust, and the calibration precision and speed can be better considered.

Description

Technical field [0001] The present invention relates to the field of electronic circuit technology, and more particularly to a segmentation calibration method of a secondary approximation modulus converter based on minimum average algorithm. Background technique [0002] Analog-to-Digital Converter (ADC) is an indispensable interface module that implements continuous analog signals to discrete digital signals. There are many kinds of ADC, but the SUCCESSIVEAPPROXIMATION Rigister, SAR) ADC, due to simple structure, small area, low power consumption, and more suitable for advanced processes, etc., in portable consumer electronics , Medical device equipment, industrial control, etc. have been widely concerned and applied. In the above-mentioned application field, a higher requirement for the performance of SAR ADCs. The capacitance-based SARADC obtains the digital encoding corresponding to the input signal from the high to the lower position by sequentially comparing the voltage val...

Claims

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Application Information

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IPC IPC(8): H03M1/10H03M1/46
CPCH03M1/1009H03M1/468
Inventor 万培元杨国瀚
Owner BEIJING UNIV OF TECH
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