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CMU test method, device and system

A test method and test instruction technology, which is applied in the direction of measuring devices, measuring electricity, and measuring electrical variables, etc., can solve the problems of low test efficiency and high test cost of CMU, and achieve the effect of realizing automated test, reducing test cost and improving test efficiency

Pending Publication Date: 2022-04-01
章鱼博士智能技术(上海)有限公司
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the embodiments of the present invention provide a CMU testing method, device and system to overcome the problems of low test efficiency and high test cost in the prior art of manual testing of CMUs designed by AFE chips from different manufacturers

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  • CMU test method, device and system
  • CMU test method, device and system
  • CMU test method, device and system

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Embodiment Construction

[0053] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present invention.

[0054] The technical features involved in different embodiments of the present invention described below may be combined with each other as long as they do not constitute a conflict with each other.

[0055] The current battery module uses BMS integrated or split type collection. For split-type acquisition CMU, its flexibility is better than that of integrat...

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Abstract

The invention provides a CMU test method, device and system, and the method comprises the steps: obtaining the information of a battery sampling chip corresponding to a to-be-tested CMU and a test demand; based on the type of the battery sampling chip, a communication protocol between a BMU simulator and the CMU to be tested is configured, and the BMU simulator is used for simulating the function of the BMU; based on the number of the battery sampling chips and the configuration information of each battery sampling chip, configuring a corresponding acquisition channel of each battery sampling chip in the BMU simulator; generating a first test instruction based on the test demand; and sending the first test instruction to the BMU simulator, so that the BMU simulator converts the first test instruction into a second test instruction according to the communication protocol, and sends the second test instruction to the CMU to be tested for testing. According to the invention, the automatic test of the CMU is realized, the test efficiency of the CMU is improved, the test cost is reduced, corresponding test instructions are generated according to different test requirements, the test flexibility is higher, and the function test is more comprehensive.

Description

technical field [0001] The invention relates to the technical field of batteries, in particular to a CMU testing method, device and system. Background technique [0002] The battery management system (BMS for short) is mainly composed of a cell monitor unit (CMU for short) and a battery management unit (BMU for short). Among them, the CMU is responsible for measuring the voltage, current and Temperature and other parameters, as well as functions such as equalization, BMU is responsible for evaluating the data transmitted by the CMU, if the data is abnormal, it will protect the battery, and also realize the management of battery power and temperature. [0003] The current battery module uses BMS integrated or split type collection. For split-type acquisition CMU, its flexibility is better than that of integrated type. In practical applications, battery sampling chips (Analog front end) from different manufacturers are often used to design CMUs. The resulting problem is the p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/20G01R31/396
Inventor 张建彪杨红新其他发明人请求不公开姓名
Owner 章鱼博士智能技术(上海)有限公司
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