Self-detection analog-to-digital converter bit error rate test method and test system

Abstract

The invention relates to a self-detection analog-to-digital converter bit error rate test method and test system. The system adopts a power supply analyzer to provide power supply signals for an analog-to-digital converter chip to be tested and other devices; the industrial personal computer writes the configuration instruction of the to-be-tested analog-to-digital converter chip into the to-be-tested analog-to-digital converter chip through a configuration module according to a configuration time sequence required by the to-be-tested analog-to-digital converter chip; the UPS operation monitoring module monitors the voltage of each power supply of the analog-to-digital converter chip to be tested on the test evaluation board, and feeds back power supply'invalid 'state information to the industrial personal computer if the jitter of any power supply voltage is greater than a preset threshold value; otherwise, feeding back the effective state information of the power supply to the industrial personal computer; and the industrial personal computer is used for carrying out error rate statistics according to the data uploaded by the acquisition operation module when the power supply is in an effective state, otherwise, discarding the data uploaded by the acquisition operation module, and stopping the error rate test until the total data volume participating in the error rate statistics meets the requirement or the error rate exceeds a threshold value.

Description

technical field [0001] The invention relates to a self-detection analog-to-digital converter bit error rate testing method and a testing system, which are designed for the long test cycle of the bit error rate of the analog-to-digital converter and many uncertain factors, and belong to the technical field of the analog-to-digital converter. Background technique [0002] In many practical application fields, it is required that the analog-to-digital converter does not allow high conversion errors. Such applications as measurement equipment, life system health monitoring, radar and electronic warfare, etc., need to complete the precise monitoring of extremely weak signals, transient signals and instantaneous signals, and false triggering may cause accidents or even system failures. Therefore, it becomes very important to be able to accurately quantify the conversion bit error rate of the analog-to-digital converter. [0003] However, the bit error rate test often takes a long...

AI Technical Summary

Problems solved by technology

[0004] The technical problem solved by the present invention is to provide a self-detection analog-to-digital converter bit error rate testing method and testing system for the problem of long test period and large uncertainty of the bit error rate, which can detect the bit error rate of the analog-to-digital converter Detect power supply voltage at the same time, high test efficiency, safe and reliable

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