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Spectrometer for detecting quantum optical material

A technology of quantum optics and spectrometers, applied in the field of spectrometers, can solve problems such as waste of time and manpower, and achieve the effects of saving waste, shortening time and manpower costs

Pending Publication Date: 2022-04-15
广域兴智能(南通)科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, there is no optical detection equipment independently developed for quantum optical materials in the industry, because it requires the concept of using WRGB backlight module and LCD display at the same time, coupled with the combination of spectrum analyzer, which belongs to a niche market, but it can save optical materials in Production process and development costs
At present, there is no color saturation detection in the production process of quantum dot optical materials, and the brightness, color coordinates and color saturation can only be measured after they are sent to the client for LCD module assembly. An optical inspection is required, which is a waste of time / material / manpower

Method used

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  • Spectrometer for detecting quantum optical material
  • Spectrometer for detecting quantum optical material
  • Spectrometer for detecting quantum optical material

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Embodiment Construction

[0028] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them; based on The embodiments of the present invention and all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0029] Depend on Figure 1-8 Provided, the present invention discloses a spectrometer for detecting quantum optical materials, including a spectrometer housing 100, the spectrometer housing 100 is used to protect the internal optical integrator, a cavity is provided in the spectrometer housing 100 to form a darkroom 102, and the spectrometer housing 100 The support rod 130 is installed on the top of the detection platform 200, the support rod 13...

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Abstract

The invention discloses a spectrograph for detecting a quantum optical material, which comprises a spectrograph shell, a cavity is arranged in the spectrograph shell to form a darkroom, a light guide hole is arranged at the front end of the darkroom, the spectrograph shell is arranged above a detection platform through a support rod, an optical integrator assembly is arranged in the spectrograph shell, and the optical integrator assembly is arranged in the spectrograph shell. A backlight assembly is arranged in the detection platform, and the optical integrator assembly is matched with the backlight assembly to detect the quantum optical material. The integrator assembly comprises an optical integrator computer and an optical integrator lens and controller, the optical integrator lens and controller are installed in the spectrograph shell, the lens faces downwards, and the optical integrator computer is located in the detection platform. In the implementation process, time and labor cost can be shortened, and material waste is reduced.

Description

technical field [0001] The invention belongs to the technical field of spectrometers, in particular to a spectrometer for detecting quantum optical materials. Background technique [0002] At present, there is no optical detection equipment independently developed for quantum optical materials in the industry, because it requires the concept of using WRGB backlight module and LCD display at the same time, coupled with the combination of spectrum analyzer, which belongs to a niche market, but it can save optical materials in Production process and development costs. At present, there is no color saturation detection in the production process of quantum dot optical materials, and the brightness, color coordinates and color saturation can only be measured after they are sent to the client for LCD module assembly. An optical inspection is required, which is a waste of time / material / manpower. Contents of the invention [0003] In view of the above situation, in order to overc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/25
CPCG01N21/255
Inventor 许铭富许书元
Owner 广域兴智能(南通)科技有限公司
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