Y waveguide polarization characteristic parameter measurement method based on noise reduction processing
A measurement method and characteristic parameter technology, which is applied in the field of optical measurement, can solve problems such as unrealized measurement of polarization characteristic parameters, failure to realize distributed measurement of Y waveguide devices, etc.
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[0050] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0051] Such as figure 1 As shown, it is an overall flow chart of a method for measuring Y waveguide polarization characteristic parameters based on noise reduction processing in the present invention.
[0052] Step 1. Build as figure 2 It is a schematic diagram of the polarization-maintaining optical fiber interferometry system of the present invention, including a light source module 1, a polarizer 2, a Y waveguide device 3, a polarizer 4, a 3dB coupler 5, an electronically controlled delay line 6, a Faraday rotation mirror 7, a photoelectric detector Device 8, data acquisition card 9 and computer 10. Among them: the light source module 1 is an ultra-broadband light source, the light emitted is linearly polarized light, and the tail end of the Y waveguide device 3 and the polarizer 4 are welded together at an ang...
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