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Depth measurement system and method

A depth measurement and depth technology, applied in radio wave measurement systems, measurement devices, image analysis, etc., can solve the problems of high memory usage and power consumption, and achieve the effect of reducing memory usage and power consumption

Pending Publication Date: 2022-05-27
深圳锐视智芯科技有限公司
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The embodiment of the present application provides a depth measurement system and method, which can at least solve the problems of large power consumption and high memory usage caused by the distance measurement technology provided in the related art requiring the depth measurement system to keep working.

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Embodiment Construction

[0022] In order to make the purpose, features and advantages of the invention of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. The embodiments described above are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of this application.

[0023] In the description of the embodiments of the present application, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical" ", "horizontal", "top", "bottom", "inside", "outside", etc. indicate the orientation or positional relationship based on the orienta...

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Abstract

The invention provides a depth measurement system and method. An acquisition module firstly acquires a reflected light signal reflected by a target object through an event pixel array to generate an event signal; the processor generates an event image according to the event signal, and sends a depth pixel activation instruction to the acquisition module when identifying that a target object in the event image is an effective measurement object; the acquisition module responds to the depth pixel activation instruction, and acquires a reflected light signal through a depth pixel array to generate an electric signal; the processor finally calculates a depth value of the target object based on the electrical signal. Through the implementation of the scheme, whether the depth measurement condition is met or not is detected through the event pixels, and depth measurement is started only when the condition is met, so that the power consumption of the transmitting module and the collecting module can be reduced, and meanwhile, the occupation of redundant data on a memory is reduced.

Description

technical field [0001] The present application relates to the technical field of machine vision, and in particular, to a depth measurement system and method. Background technique [0002] The depth measurement system can be used to obtain the depth image of the object, and further can perform 3D modeling, skeleton extraction, face recognition, etc., and has a very wide range of applications in the field of 3D measurement and human-computer interaction. The current depth measurement technologies mainly include TOF ranging technology and structured light ranging technology. [0003] TOF ranging technology is a precise ranging technology by measuring the round-trip flight time of light pulses between the transmitter / receiver device and the target object. It is divided into direct ranging technology and indirect ranging technology. Among them, the indirect ranging technology measures the phase delay of the reflected optical signal relative to the transmitted optical signal, and...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/514G01S17/08
CPCG06T7/514G01S17/08
Inventor 万小芳邓坚
Owner 深圳锐视智芯科技有限公司