Wafer-level chip packaging process
A wafer-level chip and packaging process technology, applied in the direction of replication/marking method, temperature recording method, semiconductor/solid-state device testing/measurement, etc. The effect of reducing cracking and eliminating air bubbles
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[0024] Detailed reference will be made below to embodiments of the present invention. Although the present invention is illustrated and described with reference to these embodiments, it should be noted that the present invention is not limited only to these embodiments. On the contrary, the present invention covers all alternatives, modifications and equivalents within the spirit and scope of the invention as defined by the appended claims.
[0025] A wafer level 1 chip packaging process, the specific steps are as follows:
[0026] Step 1: Affix the film, and paste a protective film on the front side of the wafer 1 to protect the circuit on the front side of the wafer 1.
[0027] Step 2: Plant balls, and place solder balls on the UBM openings; reflow and clean.
[0028] Step 3: Test, test the electrical properties of each chip through a test probe, distinguish good and bad products, and divide each chip on the wafer into good and bad products according to the test results of...
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