CPU power supply performance test system and method and storage medium

Abstract

The invention relates to the field of CPU power supply performance test, and particularly discloses a CPU power supply performance test system and method and a storage medium, a switch board is arranged between a test resistor of a power supply to be tested and a frequency response analyzer, and an upper computer is connected with the switch board and an oscilloscope; a test control program is further configured in the upper computer, the test control program is executed to load a frequency sweep script, the VRTT software is used for controlling the VRTT test tool to carry out dynamic response test on output voltage of the power supply to be tested and jitter test on PWM switching signals, test data and waveforms are obtained from the oscilloscope, the on-off state of the switch board is controlled, and when the switch board is switched on, the frequency sweep script is loaded; the frequency response analyzer is controlled by the frequency response instrument software to carry out a Baut diagram test of a feedback loop on the power supply to be tested, and test data is acquired from the frequency response analyzer. According to the method and the device, automatic execution of the Transient test, the Jitter test and the BodePlot test is realized through program control, the labor cost is reduced, the labor burden is relieved, the test efficiency is improved, and interference of a BodePlot test line on the Jitter test is avoided.

Description

Technical field [0001] The invention involves the field of CPU power performance testing, which specifically involves a CPU power performance test system, method and storage medium. Background technique [0002] The dynamic response and stability of the power supply is an important indicator of the power supply quality of the power supply. The relevant power test items are: the dynamic response of the output voltage (Transient) test, the jitter test of the PWM switch signal (Jitter), the wave of the feedback ring circuitBodePlot test. [0003] Taking the anti -voltage DCDC power supply to the CPU as an example.The Transient test is to test the fluctuation of the output voltage when the power output current is constantly changing.The Jitter test is to test the shake size of the PWM signal when the power output current is constant. The more nicknames, the better the stability of the power supply.BODEPLOT test is that when the power output current is constant, the frequency response...

AI Technical Summary

Problems solved by technology

1) Among the above three tests, the Transient test has the most items and takes the longest time. Each frequency sweep needs to run a test script, and the running time is about 1-2 hours. The existing solution can only wait for a frequency sweep script to run. , grab the waveform to confirm the test result, and then scan the frequency of the next test item. During the whole test process, the tester needs to confirm the frequency scanning progress every 1-2 hours. After the current frequency scanning script is executed, confirm the test result and then run the next A scanning script, the test process is complicated, and the utilization rate of personnel is low

To capture the test waveform during the test, it is necessary to manually set the VRTT loading conditions, adjust the oscilloscope, and read the test data. There is a possibility of human error and the efficiency is low

[0010]2) For a newly designed circuit, it is inevitable that the control parameters and the circuit will not match. When the test results do not meet the requirements, adjust the VR parameters to make the One item meets the requirements, but the change of parameters may make another test not meet the requirements, and the VR parameters must be adjusted again to retest all test items. A large number of retests make VR parameter tuning complicated and difficult

[0011]3) The BodePlot test requires the frequency response analyzer to be connected to the measurement resistor of the power supply feedback terminal through the test line, which brings additional noise to the power supply feedback loop, resulting in Jitter The value is too large, so the frequency response analyzer needs to be disconnected during the Jitter test

In the process of parameter tuning, it is necessary to frequently connect and disconnect the frequency response analyzer, which affects the execution of automated tests

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