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Industrial process small sample fault diagnosis method based on deep optimal feature transmission

An optimal feature and fault diagnosis technology, applied in the direction of comprehensive factory control, instrumentation, adaptive control, etc., can solve the problems of lack of incremental learning mechanism in domain adaptation methods, achieve short calculation cycle, low algorithm complexity, and High transplantability effect

Active Publication Date: 2022-07-12
PEKING UNIV
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Problems solved by technology

However, because industrial fault signals cannot provide a large number of reliable adaptable source domains, and the current domain adaptation method lacks an incremental learning mechanism, similarity learning is shallow, and there is no fast and accurate diagnostic method for industrial small-sample fault diagnosis. Therefore, It is urgent to effectively combine intelligent technology with industrial fault data analysis to form a complete fault diagnosis method for small sample problems

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  • Industrial process small sample fault diagnosis method based on deep optimal feature transmission
  • Industrial process small sample fault diagnosis method based on deep optimal feature transmission
  • Industrial process small sample fault diagnosis method based on deep optimal feature transmission

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Embodiment Construction

[0020] The present invention is further described below with reference to the accompanying drawings and specific embodiments, but does not limit the scope of the present invention in any way.

[0021] like figure 1 As shown, the small-sample fault diagnosis method based on deep optimal feature transmission provided by the present invention is mainly divided into four steps: constructing a fault adaptation task set, characterizing the task set in the embedding space, and modeling the paradigm learned in the embedding space. Identification and parameter estimation, updating the model transmission depth optimal features, and obtaining the fault classification results under unknown tasks.

[0022] The invention constructs a small-sample fault diagnosis network model: including an adaptive network model and a non-adaptive network model; the adaptive network model can include multi-layer networks, which are respectively used for fixing through the training of the source domain, and ...

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Abstract

The invention discloses an industrial process small sample fault diagnosis method based on deep optimal feature transmission, and the method comprises the steps: constructing a reduced source domain and target domain deep adaptation network based on domain adaptation, carrying out the analysis of industrial small sample fault data, and rapidly building an industrial small sample fault diagnosis quantitative model based on deep optimal feature transmission; constructing a fault adaptation task set according to the historical fault adaptation tasks; representing the fault adaptation task set in an embedding space; and carrying out model identification and parameter estimation on the normal form learned by the embedded space, and updating the optimal characteristics of the transmission depth of the model, thereby obtaining a fault classification result under an unknown fault task. According to the method, the fault type of the sparse heterogeneous industrial signals under different working conditions can be accurately predicted, the algorithm complexity is low, the calculation period is short, and the portability is high.

Description

technical field [0001] The invention belongs to the technical field of industrial process fault diagnosis and processing, relates to a small-sample machine learning technology, and in particular relates to a small-sample fault diagnosis method for an industrial process based on deep optimal feature transmission. Background technique [0002] Industry is the lifeblood of the national economy. With the vigorous development of sensor technology, today's industrial field has gradually formed an environment suitable for industrial process data information and sensing technology. Therefore, the data-driven model-free intelligent diagnosis methods have been unprecedentedly developed. The success of these techniques depends on having sufficient labeled data, however, in practical applications, the collection of labeled data for industrial processes is difficult. It is mainly reflected in the heterogeneity and sparseness of industrial data distribution, such as industrial equipment ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B13/04
CPCG05B13/042Y02P90/02
Inventor 于歌张玺
Owner PEKING UNIV
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