Dual wavelength two-dimensional space phase shifting electronic speckle interferometer

An electronic speckle interference and two-dimensional space technology, which is applied in the direction of instruments, measuring devices, and optical devices, can solve the problems that the interference fringes cannot be directly obtained, not obtained at the same time, and the practicality and engineering value are reduced, so as to achieve light weight , easy post-processing, high power effect

Inactive Publication Date: 2006-11-08
NO 711 RES INST CHINA SHIPPING HEAVY IND GRP
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Problems solved by technology

Depend on figure 2 It can be seen that the instrument can directly and independently obtain the U field and the V field, but the U field and the V field are not obtained at the same time
[0007] The light source used by the three-dimensional electronic speckle interferometers of the above two com

Method used

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  • Dual wavelength two-dimensional space phase shifting electronic speckle interferometer
  • Dual wavelength two-dimensional space phase shifting electronic speckle interferometer
  • Dual wavelength two-dimensional space phase shifting electronic speckle interferometer

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[0036] See image 3 , Figure 4 , See for cooperation Figure 5 , Figure 6 , Figure 7 . The dual-wavelength two-dimensional space phase-shift electronic speckle interferometer of the present invention includes an instrument frame 1 and two sets of laser irradiation mechanisms 2 mounted on the frame (for cooperation see Figure 5 ), 3 (for cooperation see Figure 6 ), interference receiving mechanism 4, four groups of laser reflection mechanisms 5, 6, 7, 8 and space phase shift mechanism 9.

[0037] The instrument frame 1 includes a main frame 11 and four extension arms 12 connected to the main frame in a cross-distribution. The main frame 1 is provided with four support bases 13, and each support base is connected with a magnetic meter base 14 respectively. The main frame 1 consists of A vertical partition 15 is divided into left and right cavities.

[0038] See also Figure 5 , Figure 6 . The two sets of laser irradiation mechanisms 2 and 3 are the pump red laser irradiation me...

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Abstract

A dual-wavelength two-dimensional space phase shift electronic speckle interferometer mainly includes two sets of laser irradiation mechanisms, an interference receiving mechanism, four sets of laser reflection mechanisms and a space phase shifting mechanism. The two groups of laser irradiation mechanisms are the pumping red laser irradiation mechanism and the pumping green laser irradiation mechanism. The present invention simultaneously uses a 644.6nm pumping red laser and a 532nm pumping green laser as light sources to obtain U field and V field respectively; adopts interference filters with different wavelengths, so that the U field and V field in three-dimensional deformation can be independent Separated; and through the spatial phase shifter (deflection carrier film) to realize the digitization of fringes, the interference fringes of pure U field and V field can be directly and simultaneously obtained, and the spatial phase shift function is added to realize the digitization of fringes.

Description

technical field [0001] The invention relates to an optoelectronic instrument, in particular to a dual-wavelength two-dimensional space phase-shift electronic speckle interferometer. Background technique [0002] Electronic Speckle Pattern Interferometry (ESPI) is a comprehensive technology combining computer image processing, laser and interference. [0003] The electronic speckle interferometer is widely used in the application, research and teaching experiments in the field of photomechanics. The non-contact measurement can obtain the fringes of the field displacement field (U, V field) in the surface of the measured object, and provide reliable boundary conditions for the finite element. . It can be used for structural optimization, and can be applied in mesomechanics, residual stress measurement, and composite material research. Especially widely used in structural analysis and non-destructive testing. Obtain the information needed by the designer through necessary po...

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Application Information

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IPC IPC(8): G01B9/02
Inventor 张熹陆鹏吴君毅夏远富
Owner NO 711 RES INST CHINA SHIPPING HEAVY IND GRP
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