Dual wavelength two-dimensional space phase shifting electronic speckle interferometer

Abstract

A dual-wavelength two-dimensional space phase shift electronic speckle interferometer mainly includes two sets of laser irradiation mechanisms, an interference receiving mechanism, four sets of laser reflection mechanisms and a space phase shifting mechanism. The two groups of laser irradiation mechanisms are the pumping red laser irradiation mechanism and the pumping green laser irradiation mechanism. The present invention simultaneously uses a 644.6nm pumping red laser and a 532nm pumping green laser as light sources to obtain U field and V field respectively; adopts interference filters with different wavelengths, so that the U field and V field in three-dimensional deformation can be independent Separated; and through the spatial phase shifter (deflection carrier film) to realize the digitization of fringes, the interference fringes of pure U field and V field can be directly and simultaneously obtained, and the spatial phase shift function is added to realize the digitization of fringes.

Description

technical field [0001] The invention relates to an optoelectronic instrument, in particular to a dual-wavelength two-dimensional space phase-shift electronic speckle interferometer. Background technique [0002] Electronic Speckle Pattern Interferometry (ESPI) is a comprehensive technology combining computer image processing, laser and interference. [0003] The electronic speckle interferometer is widely used in the application, research and teaching experiments in the field of photomechanics. The non-contact measurement can obtain the fringes of the field displacement field (U, V field) in the surface of the measured object, and provide reliable boundary conditions for the finite element. . It can be used for structural optimization, and can be applied in mesomechanics, residual stress measurement, and composite material research. Especially widely used in structural analysis and non-destructive testing. Obtain the information needed by the designer through necessary po...

AI Technical Summary

Problems solved by technology

Depend on figure 2 It can be seen that the instrument can directly and independently obtain the U field and the V field, but the U field and the V field are not obtained at the same time

[0007] The light source used by the three-dimensional electronic speckle interferometers of the above two companies is a laser light source, neither of which can directly obtain independent U and V interference fringes, and the U field and V field must be obtained indirectly by solving simultaneous equations

This will inevitably bring large errors, greatly reducing its practicality and engineering value.

Images