Metal in-situ statistical-distribution analysis method

A technology of statistical distribution and analysis method, which is applied in the field of material analysis, can solve the problems of unable to analyze the distribution of elements and inclusions, unable to record the position of a single discharge, unable to observe abnormal sparks, etc., to avoid errors, strong practicability, Quantitatively Accurate Effects
CN1375692AInactive Publication Date: 2002-10-23NCS TESTING TECH

Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Applications(China)
Current Assignee / Owner
NCS TESTING TECH
Publication Date
2002-10-23
Estimated Expiration
Not applicable ยท inactive patent

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Abstract

The metal in-situ statistical distribution analysis method, mainly relates to chemical components and its state analysis of metal amterial, which includes the following steps: exciting light-source system to implement precombustion-free continuous excitation of sample and synchronous scanning location, making excited spectrum become into linear spectrum, collecting and recording spectrum intensity of single spark discharge, statistically analyzing collected and stored spectral line intensities of linear spectrums, using computer to process said data so as to measure the parameters of chemicalcomponent, segregation, looseness and foreign impurity distribution of sample.
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Description

technical field

[0001] The invention belongs to the field of analyzing materials by means of measuring their physical properties, and mainly relates to the chemical composition and state analysis of metal materials. Background technique

[0002] Chemical composition, segregation, surface defects, and content of inclusions are the four most important items in the quality control of steel production. In the prior art, the sulfur printing test is used to test the segregation or distribution of elements in steel, the acid leaching test is used to test the porosity of the center, and the metallographic method is used to test the shape and distribution of inclusions. The above-mentioned traditional methods have complicated procedures and slow analysis speed. , the result cannot be quantified ("Optical Microanalysis" P21-40 Tsinghua University Press by Sun Yeying, 1996.10).

[0003] The spark source atomic emission spectrometer in the prior art can analyze the chemical composition...

Claims

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