Unlock instant, AI-driven research and patent intelligence for your innovation.

Method and appts. for varying magnetic field to control volume of plasma

A plasma and equipment technology, applied in the field of plasma control, can solve the problems of high electron temperature, damage to the substrate processing chamber, etc.

Inactive Publication Date: 2003-07-23
LAM RES CORP
View PDF4 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Increased power density leads to higher electron temperatures in the plasma and consequently to possible damage to the substrate and chamber

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and appts. for varying magnetic field to control volume of plasma
  • Method and appts. for varying magnetic field to control volume of plasma
  • Method and appts. for varying magnetic field to control volume of plasma

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The invention will now be described in detail with reference to preferred embodiments shown in the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, it will be apparent to one skilled in the art that the present invention is not limited to some or all of these specific details. Details of processing steps known in other embodiments are not described in order not to obscure the present invention.

[0026] In one embodiment of the invention a plasma processing apparatus for processing a substrate is provided. A plasma processing apparatus includes a generally cylindrical processing chamber defined by at least a portion of walls within which a plasma for substrate processing is induced and maintained.

[0027] The substrate is placed on the chuck in the plasma processing chamber to perform plasma processing on the substrate. A process gas input into...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A plasma confinement arrangement for controlling the volume of a plasma while processing a substrate inside a process chamber includes a chamber within which a plasma is both ignited and sustained for processing. The chamber is defined at least in part by a wall and further includes a plasma confinement arrangement. The plasma confinement arrangement includes a magnetic array disposed around the periphery of the process chamber configured to produce a magnetic field which establishes a cusp pattern on the wall of the chamber. The cusp pattern on the wall of the chamber defines areas where a plasma might damage or create cleaning problems. The cusp pattern is shifted to improve operation of the substrate processing system and to reduce the damage and / or cleaning problems caused by the plasma's interaction with the wall. Shifting of the cusp pattern can be accomplished by either moving the magnetic array or by moving the chamber wall. Movement of either component may be continuous (that is, spinning one or more magnet elements or all or part of the wall) or incremental (that is, periodically shifting the position of one or more magnet elements or all or part of the wall).

Description

Background of the invention [0001] The present invention relates to methods and apparatus for processing substrates such as semiconductor substrates used in the manufacture of integrated circuits (ICs) or glass plates used in flat panel displays. More specifically, the present invention relates to a method of controlling a plasma within a plasma processing chamber. [0002] Plasma processing systems have been available for many years. Plasma processing systems utilizing inductively coupled plasma sources, electron cyclotron resonance (ECR) sources, capacitive sources, etc. have been introduced to various degrees for processing semiconductor substrates and glass sheets over the years. [0003] During processing, multiple deposition and / or etch steps are typically used. During deposition, various materials are deposited onto the surface of a substrate such as glass or a semiconductor wafer. For example, such as SiO can be formed on the surface of the substrate 2 deposition l...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01J37/32
CPCH01J37/32623H01J37/32688H01J37/321H01L21/30
Inventor A·D·拜利D·J·赫姆克尔
Owner LAM RES CORP