Measuring method and measurer for thickness of metallic thin strip

A measurement method and thickness measurement technology, applied in measurement devices, optical devices, instruments, etc., can solve problems such as multiple calibration, metal failure, and the thickness of the measured object cannot be too thin, and achieve compact structure, rapid detection, and anti-interference. powerful effect

Inactive Publication Date: 2005-01-12
ZHEJIANG UNIV
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  • Abstract
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Problems solved by technology

This is a widely used technology, safe and convenient, but because the eddy current effect is related to the type of metal, this method is ineffective for som

Method used

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  • Measuring method and measurer for thickness of metallic thin strip
  • Measuring method and measurer for thickness of metallic thin strip

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Embodiment Construction

[0011] Such as figure 1 As shown, including low coherence light source, the first Michelson interferometer, the second Michelson interferometer, the first, second, third light transmission system, photoelectric receiver, signal processor; the first Michelson The interferometer and the second Michelson interferometer are placed on both sides of the measured metal strip, a low-coherence light source is irradiated to the beam splitter in the first Michelson interferometer through the first light transmission system, and the interfering light passes through the second The second optical transmission system is sent to the optical splitter in the second Michelson interferometer, and the interference light is connected to the signal processor through the third optical transmission system and the photoelectric receiver.

[0012] Such as figure 2 Shown, is an embodiment of the present invention, and this device comprises broadband light source 1, lens L 1 , optical fiber 5, includin...

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Abstract

Metal sheet band to be measured is positioned between two Michelson interferometers. Two corresponding surfaces of metal sheet band to be measured are as a reflecting surface for each interferometer. The two Michelson interferometers are cascaded to form a differentiate interference system. A light source in low degree of coherence through first light transmission system irradiates onto first Michelson interferometers, from which output light through second light transmission system as a light source irradiates onto second interferometers. Opto-electronic receiver receives output light from the second interferometers through third transmission system. After signal processor carries out process, thickness of metal sheet band is obtained. Advantages are: high measuring sensitivity, and antivibration. The invention is suitable to opaque object with high reflectivity in both surfaces, and very thin sheet band with no substrate supported or with transparent substrate supported.

Description

Technical field [0001] The invention relates to a measuring device characterized by adopting an optical method, in particular to a measuring method and a measuring device for the thickness of a thin metal strip. Background technique [0002] Metal precision strips generally have a thickness of less than 100um, and currently they are mainly between 100um and 10um, which are high value-added products. In the production process of metal strip, thickness control is very important and is an indispensable key technology. At present, the main technologies in thickness measurement at home and abroad are: 1. Thickness measurement by ray method. The thickness of the thin strip can be measured according to the different degrees of interaction between the thin strips of the same metal with different thicknesses and rays. Since the degree of interaction (absorption, dispersion) between different metals and rays is different, each metal must be calibrated with its own standard sheet (mu...

Claims

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Application Information

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IPC IPC(8): G01B11/06
Inventor 严惠民杜艳丽施柏煊
Owner ZHEJIANG UNIV
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