Static testing system for optical memory specificity

Abstract

The system includes test and monitored observation two parts. Characters are that the object lens positioned on platform of control system in 3D programmable nano size is carried movement in three dimensions in order to realize approach and scan of reading / writing light spot. Thus, in procedure of reading / writing information, there is relative motion between light spot and sample in slow speed so as to realize automatic measurement. More over, the system also can test optical storage characteristic in quasi dynamic. Illumination light is inducted through optical fiber possessing high efficiency of transferring light, good pliability, easy to change length. Thus, the monitored observation system has good flexibility.

Description

Technical field: [0001] The invention relates to optical storage materials, in particular to a static test system for optical storage properties. Mainly used for optical storage materials such as CD-R, CD-RW, DVD-R, and DVD-RW Static testing and quasi-dynamic testing of storage properties. technical background: [0002] The static test of optical storage characteristics refers to determining the relationship between the signal contrast and erasing rate of optical storage materials and the writing wavelength, writing power, writing pulse width, erasing wavelength, erasing power and erasing pulse width. During the measurement process, There is no relative movement between the read and write spot and the storage material. The dynamic test of optical storage characteristics refers to the characteristic test when there is relative movement between the read-write light spot and the storage material. [0003] In the prior art, there is a static test system for storage characteri...

AI Technical Summary

Problems solved by technology

[0005] 2) The incandescent lamp is used as the light source in the monitoring and observation system, which requires some beam control components, which makes the observation system less flexible;

[0006] 3) Only static tests can be performed on the storage characteristics of optical storage materials, and nothing can be done for dynamic or quasi-dynamic tests;

[0007] 4) The test system uses the sample scanning method for testing, which has high requirements for samples, which limits the scope of use of the measurement system

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