Inspecting apparatus and waveform display apparatus

A technology for inspection devices and waveform display, applied in the direction of digital variable/waveform display, measuring device, cathode ray oscilloscope, etc.

Inactive Publication Date: 2005-03-09
MITSUBISHI ELECTRIC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, at this time, although there is an effect of reducing trouble by utilizing the goal orientation, there is a problem of fully implementing the programming of the display screen and its debugging behavior.

Method used

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  • Inspecting apparatus and waveform display apparatus
  • Inspecting apparatus and waveform display apparatus
  • Inspecting apparatus and waveform display apparatus

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Embodiment Construction

[0026] Prerequisite Technology for Invention

[0027] In the production line or production system, after some processing or assembly of the manufactured product, in order to check whether the completed product or semi-finished product is qualified, an inspection device is used for inspection. The inspection device gives test signals to each part of the inspection object, that is, the manufactured product, in a prescribed order. The signal passes through each functional block of the manufactured product, and the response signal is detected by the inspection device. When the response signal is within the predetermined range, it is determined that the manufactured product is a good product, and when it is outside the predetermined range, it is determined as a non-defective product. Non-conforming products are reworked, or checked by the inspection device again, or eliminated from the production line.

[0028] For example, in the case of electrical products, it is composed of va...

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PUM

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Abstract

To improve efficiency of debug by detecting external signal and program variable independently from a program for describing procedure and normalized value for executing inspection and a program for indicating waveform on a screen, simultaneously indicating both waveforms on the same screen, and facilitating comparison of both sides. The inspection device inspects according to an inspection program and comprises an execution means for inspecting according to the inspection program, a memory means storing the program variable in the inspection program and the external signal input and output from the inspection device, and a waveform display means selecting a specific signal from the program variable and the external signal and displaying the waveform. The device is characterized in that the program variable and the external signal can be displayed by waveform independently from the execution means of the inspection program.

Description

field of invention [0001] The present invention relates to an inspection device suitable for product inspection in production lines or production systems of general industrial products such as electrical products and mechanical products, and in particular to a programmable inspection device that realizes inspection sequence and judgment processing according to inspection objects through programming. Background technique [0002] Conventionally, as a method of programming a computer, the computer includes: a memory for storing information defining a plurality of executable functions and a plurality of data formats; a display device for displaying an image for controlling at least one of a virtual device and a device; The device for user input and the data processor, the method includes: a step of combining data flow graphs according to user input, the data flow graph is used as a data flow graph on the display device, including: and the plurality of a function icon correspond...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R13/20G01R13/00G01R31/00G01R31/28
CPCG01R13/28G01R31/31705
Inventor 末次伸浩岩井裕三前田康之南出英明
Owner MITSUBISHI ELECTRIC CORP
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