Method for preparing specimen in use for researching DNA through microscope in atomic force
An atomic force microscope and sample technology, applied in biochemical equipment and methods, microbial measurement/inspection, surface/boundary effects, etc., can solve problems such as uncontrollability, destruction, and waste of DNA samples
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment 1
[0012] 12.5ng / μl λ~DNA with 12.5mM Mg 2+ The mixed solution was heated at 38°C for 30 minutes, and 20 μl of it was dropped on the 1.5cm 2 Adsorb the newly dissociated mica surface for 7-8 minutes (25°C), diffuse the mica in ultra-pure water for 30 minutes at 4°C, take it out and put it in absolute ethanol for 30 seconds, and finally place it at 25°C under nitrogen protection Dry for 2 hours. Atomic force microscope characterization This method prepared DNA compact monomolecular film.
Embodiment 2
[0014] The mixed solution of 2.5ng / μl plasmid DNA pBR 322 and 2.5mM magnesium acetate was heated at 38°C for 30 minutes, and 20μl was dropped on 1.5cm 2 Adsorb the newly dissociated mica surface for 7-8 minutes (25°C), diffuse the mica in ultrapure water for 30 minutes at 4°C, take it out and place it in absolute ethanol for 30 seconds, and finally place it at 25°C under nitrogen protection Dry for 2 hours. Atomic Force Microscopy Characterization This method prepares expanded plasmid DNA molecules.
Embodiment 3
[0016] 2.5ng / μl linear DNA pBR 322 / PstI mixed with 2.5mM magnesium acetate was heated at 38°C for 30 minutes, and 20μl was dropped on 1.5cm 2 Adsorb the newly dissociated mica surface for 7-8 minutes (25°C), diffuse the mica in ultra-pure water for 30 minutes at 4°C, take it out and put it in absolute ethanol for 30 seconds, and finally store it at 25°C under nitrogen protection Dry for 2 hours. Atomic Force Microscopy Characterization This method produces fully extended linear DNA molecules.
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More