Preware measuring method based on linear phase position reversal development

A wavefront measurement and linear phase technology, applied in the field of optical information measurement, can solve the problems of reducing light energy utilization, weak incident light energy, inconsistent performance, etc.

Inactive Publication Date: 2007-01-31
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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Problems solved by technology

In applications such as astronomical adaptive optics, the incident light energy of a star target is very weak, any light splitting will reduce the utilization rate of light energy, and if there i...

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  • Preware measuring method based on linear phase position reversal development
  • Preware measuring method based on linear phase position reversal development
  • Preware measuring method based on linear phase position reversal development

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Embodiment Construction

[0078] like image 3 As shown, the wavefront sensor used to realize the method of the present invention is composed of a diffractive imaging optical system, a focal plane imaging device (such as a CCD camera), an image acquisition card, and a computer. The optical wavefront distortion at the entrance pupil of the atmospheric disturbance, and the Zernike coefficients of each order of the aberration to be measured are arranged in a vector a according to the order agreed in advance (generally in the order of the spatial frequency from low to high). The purpose of wavefront measurement It is to obtain the value of the coefficient vector a corresponding to the aberration to be measured.

[0079] The wavefront distortion φ(x, y) to be measured is imaged on the focal plane after passing through the diffractive imaging optical system. A CCD camera is placed near the focal plane to record the far-field image of the distorted wavefront. The light intensity distribution information is c...

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Abstract

The invention relates to a kind of wave front measure method basing on the linearity phase conversion. It calibrates to get the recovery matrix of the corresponding relation between the relative change values of the sensor far field light intensity and the coefficient in the incidence wave front, according to the parameters of the wavelength of the lamp-house, the focus of the sensor, the image element of the imaging device and so on. The sensor is calibrated by non-astigmation ideal plane before used. The non-astigmation far field image is regarded as the base image. Measure the incidence beam containing the aberration wave front to get the far field image in this condition. It detracts the base image to get the D-value of the light intensity distribution and form light intensity D-value as predefined. The recovery matrix multiplies the light intensity D-value to get the coefficient of the aberration wave front. The invention possesses the advantages of high energy utilization ratio, little calculation and rapid calculating speed. It can be applied in the high real-time requirement field, for example, self-adaptation optics.

Description

technical field [0001] The invention belongs to the technical field of optical information measurement, and relates to a method for measuring the wavefront of an incident light beam, in particular to a novel wavefront measurement method based on linear phase inversion. Background technique [0002] In applications such as adaptive optics and optical inspection, it is necessary to measure the wavefront of a beam of light. Especially in adaptive optics systems, fast measurement of wavefront information is required for real-time control of the wavefront. At present, many methods for measuring wavefront have been developed, such as shear interferometry, Hartmann method, phase inversion method and curvature detection method. These methods have their own advantages and disadvantages, and are suitable for their respective applications. Among them, the phase inversion method and the curvature detection method are both imaging-based wavefront measurement methods, which are especiall...

Claims

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Application Information

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IPC IPC(8): G01J9/00
Inventor 李新阳李敏
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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