Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Star sensor online aligning method based on weng model

A technology of star sensor and calibration method, applied in the field of aerospace measurement

Inactive Publication Date: 2007-04-04
BEIHANG UNIV
View PDF0 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the invention is to propose a method for on-orbit calibration based on the weng model for the existing problems in the current star sensor on-orbit calibration

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Star sensor online aligning method based on weng model
  • Star sensor online aligning method based on weng model
  • Star sensor online aligning method based on weng model

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0076] The present invention will be described in further detail below. The on-orbit calibration method of the present invention is characterized in that the calibration steps are as follows:

[0077] 1. Establish star sensor attitude transformation matrix;

[0078] 1.1, establish the celestial coordinate system and the star sensor coordinate system; referring to Fig. 1, let O'-XnYnZn be the celestial coordinate system, O-XYZ be the star sensor coordinate system, the attitude angle of the star sensor is determined by right ascension α 0 , declination β 0 , and roll angle φ 0 composition, alpha 0 is the angle between the projection of the Z axis on the XnYn plane and the Xn axis; β 0 is the angle between the Z axis and its projection on the XnYn plane; φ 0 is the angle between the intersection line of the meridian plane and the XY plane and the Y axis;

[0079] 1.2. Establish the attitude transformation matrix of the star sensor; the transformation process from the celest...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An on orbit calibration method based on Weng model for the star-sensitive device includes such steps as creating a posture transform array of star-sensitive device, creating the Weng imaging model, acquiring data, calculating parameters, and calibrating.

Description

technical field [0001] The invention belongs to aerospace measurement technology, and relates to the improvement of an on-orbit calibration method for a star sensor. Background technique [0002] The star sensor is an aerospace measurement instrument that uses star observation to provide high-precision attitude information for spacecraft. The on-orbit calibration method of star sensors is a key technology in the research and application of star sensors. Usually before the star sensor is launched, its internal parameters such as principal point, focal length and distortion coefficient will be calibrated on the ground. Calibration methods include night sky calibration and starlight laboratory calibration. However, after the launch of the aircraft, due to the impact of the launch and the changes in the working environment, such as gravity, atmosphere and temperature, etc. will be different from the ground conditions, the internal parameters of the star sensor will deviate. In...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): B64G1/66
Inventor 张广军郝雪涛江洁
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products