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Nitride semiconductor laser element and fabrication method thereof

A technology of nitride semiconductors and laser components, which is applied in the direction of semiconductor lasers, laser components, and optical waveguide semiconductor structures, and can solve problems such as inability to achieve optical output, low yield, and easy sudden breakdown.

Active Publication Date: 2010-06-16
SHARP FUKUYAMA LASER CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As a result, when operating at high output powers with CW lasers, it may suffer component breakdown and fail to achieve sufficient optical output
Therefore, when they are manufactured as components operating at output powers as high as 100mW or more, not only will the yield of effectively operating components be very low, but they are prone to sudden breakdown when actually operating for long periods of time

Method used

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  • Nitride semiconductor laser element and fabrication method thereof
  • Nitride semiconductor laser element and fabrication method thereof
  • Nitride semiconductor laser element and fabrication method thereof

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0095] The structural outline of the nitride semiconductor laser element 10 of this example is shown in Figure 5 shown in the external perspective view. The structure of this nitride semiconductor laser element 10 will be described below in the manner of its manufacturing process.

[0096]In the nitride semiconductor laser element 10 of this example, in the surface of the n-type GaN substrate 101 , grooves 100 are formed at intervals of 400 μm so as to be disposed above the defect dense regions 117 . Then, on the first main plane of the n-type GaN substrate 101 having grooves 100 formed at intervals of 400 μm, the following layers are sequentially formed: an n-type GaN lower contact layer 102 having a thickness of 2.5 μm; 3.0μm n-type Al 0.05 Ga 0.95 N lower cladding layer 103; by In x1 Ga 1-x1 N quantum well layer and In x2 Ga 1-x2 Active layer 105 composed of N barrier layers alternately arranged (where x1>x2); p-type Al with a thickness of 0.01 μm 0.3 Ga 0.7 N ant...

example 2

[0101] The structural outline of the nitride semiconductor laser element 10a of this example is shown in Image 6 shown in the external perspective view. The structure of this nitride semiconductor laser element 10a will be described below in the manner of its manufacturing process. exist Image 6 In the structure of the nitride semiconductor laser element 10a shown in Figure 5 The parts found in the nitride semiconductor laser element 10 shown in are denoted by the same reference numerals, and thus detailed explanations thereof will not be repeated below. Unlike Example 1, in this example, striped grooves 115a are formed in the wafer instead of grooves 115 .

[0102] In the nitride semiconductor laser element 10a of this example, the interval between the grooves 100 formed in the n-type GaN substrate 101 is 300 μm, and, on the first principal plane of the n-type GaN substrate 101, the following layer Formed sequentially: n-type GaN lower contact layer 102 with a thicknes...

example 3

[0109] The structural outline of the nitride semiconductor laser element 10b of this example is shown in Figure 7 shown in the external perspective view. The nitride semiconductor laser element 10b is described below through its manufacturing process. exist Figure 7 In the structure shown in the nitride semiconductor laser element 10b, also find Figure 5 Portions of the nitride semiconductor laser element 10 shown are denoted by the same reference numerals, and explanations thereof will not be repeated.

[0110] In the nitride semiconductor laser element 10b of this example, an n-type GaN substrate 101 in which defect-dense regions and low-defect regions are alternately arranged at intervals of 400 μm is used. First, on n-type GaN substrate 101 , grooves 100 with a width of approximately 5 μm are formed at intervals of approximately 80 μm and a depth of approximately 3 μm so as to be disposed on both sides of defect-intensive region 117 at intervals of approximately 400 ...

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Abstract

The present invention discloses a nitride semiconductor laser element and fabrication method thereof. The semiconductor laser element comprises: a substrate; a nitride semiconductor layer disposed onthe surface of the substrate which includes an active layer for generating laser and a steam plating prevention layer for preventing the deterioration of the active layer; a strip waveguide formed inthe nitride semiconductor as light limit area; a mirror surface formed by cleaving the nitride semiconductor layer; and a groove formed on at least one side of the strip waveguide and on the mirror surface, the groove formed as the carve area having opening on the surface of the nitride semiconductor layer, and the groove has a bottom surface lies in the vicinity of the steam plating prevention layer. The surface distortion formed on the mirror surface can be reset by the groove disposed in the vicinity of the surface distortion start position, and thereby preventing the surface distortion formed in the strip waveguide of the emitted laser.

Description

technical field [0001] The present invention relates to a nitride semiconductor laser element and a manufacturing method thereof. In particular, the present invention relates to a nitride semiconductor element having a nitride semiconductor disposed on a substrate having a defect-intensive region (defect- concentrated region). Background technique [0002] The nitride semiconductor is composed of a trivalent element such as Al, Ga, or In combined with N of a pentavalent element. Because of their band structure and chemical stability, nitride semiconductors have attracted interest as materials for light-emitting elements and power devices. In particular, various attempts have been made to manufacture blue-emitting nitride semiconductor laser elements as light sources for optical information recording apparatuses. [0003] In such a nitride semiconductor laser element, a nitride semiconductor substrate having the same cleavage direction is used as the nitride semiconductor ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01S5/24H01S5/00
CPCH01S5/227
Inventor 川上俊之山崎幸生山本秀一郎
Owner SHARP FUKUYAMA LASER CO LTD