Electrochemical fabrication methods incorporating dielectric materials and/or using dielectric substrates

a technology of dielectric substrates and fabrication methods, applied in the field of electrochemical fabrication, can solve the problems of destructive separation of masking materials from substrates, and achieve the effect of reducing the number of defects and avoiding the formation of defects

Inactive Publication Date: 2005-09-08
MICROFAB
View PDF7 Cites 64 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The CC mask plating process is distinct from a “through-mask” plating process in that in a through-mask plating process the separation of the masking material from the substrate would occur destructively.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electrochemical fabrication methods incorporating dielectric materials and/or using dielectric substrates
  • Electrochemical fabrication methods incorporating dielectric materials and/or using dielectric substrates
  • Electrochemical fabrication methods incorporating dielectric materials and/or using dielectric substrates

Examples

Experimental program
Comparison scheme
Effect test

first embodiment

[0110]FIGS. 6A-6J provide schematic illustrations of side views of a sample structure at various stages of fabrication according to the process of the invention.

[0111]FIG. 6A shows the state of the process after a dielectric substrate 202 has been supplied. For illustrative purposes the dielectric substrate 202 is shown as resting upon and being surrounded by a conductive material 204 to which electrical contact may be made for the purposes of performing plating operations and the like.

[0112]FIG. 6B shows the state of the process after a seed layer material 206 has been blanket deposited over the surface of the dielectric substrate 202.

[0113]FIG. 6C shows the state of the process after a barrier layer or etch stop layer 208 has been blanket deposited over seed layer material 206.

[0114]FIG. 6D shows the state of the process after a sacrificial material 212 has been selectively deposited onto the barrier layer and any mask used during the selective deposition process has been remov...

second embodiment

[0134]FIGS. 7A-7J provide schematic illustrations of side views of a sample structure at various stages of fabrication according to the process of the invention.

[0135]FIG. 7A depicts the state of the process after a substrate 232 supported by conductive carrier 234 is supplied.

[0136]FIG. 7B shows the state of the process after a seed layer 236 is blanket deposited onto the surface of substrate 232.

[0137]FIG. 7C shows the state of the process after a patterned mask 210 is applied to the surface of the seed layer material located on substrate 232 and after a barrier layer material 238 has been deposited to the seed layer material in the regions of voids 244.

[0138]FIG. 7D depicts the state of the process after a sacrificial material 242 has been deposited over etch stop material 238.

[0139]FIG. 7E shows the state of the process after the masking material 210 has been removed resulting in formation of voids 250 over portions of the seed layer material where structural material is to ...

third embodiment

[0153]FIGS. 8A-8J provide schematic illustrations of side views of a sample structure at various stages of fabrication according to the process of the invention.

[0154]FIG. 8A depicts the state of the process after a dielectric substrate 262 and a conductive carrier 264 is supplied.

[0155]FIG. 8B depicts the state of the process after a seed layer material (e.g. a copper nickel alloy) is supplied to the surface of substrate 262.

[0156]FIG. 8C shows the state of the process after a masking material 270 is applied and patterned on the surface of seed layer material 266 and structural material 276 is deposited onto the seed layer via the openings in mask material 270.

[0157]FIG. 8D depicts the state of the process after the masking material has been removed and an etch stop material 268 has been plated over exposed regions of the seed layer as well as over the deposited structural material.

[0158]FIG. 8E shows the state of the process after a sacrificial material 272 has been blanket de...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
temperatureaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessesaaaaaaaaaa
Login to view more

Abstract

Some embodiments of the present invention are directed to techniques for building up single layer or multi-layer structures on dielectric or partially dielectric substrates. Certain embodiments deposit seed layer material directly onto substrate materials while other embodiments use an intervening adhesion layer material. Some embodiments use different seed layer materials and / or adhesion layer materials for sacrificial and structural conductive building materials. Some embodiments apply seed layer and / or adhesion layer materials in what are effectively selective manners while other embodiments apply the materials in blanket fashion. Some embodiments remove extraneous depositions (e.g. depositions to regions unintended to form part of a layer) via planarization operations while other embodiments remove the extraneous material via etching operations. Other embodiments are directed to the electrochemical fabrication of multilayer mesoscale or microscale structures which are formed using at least one conductive structural material, at least one conductive sacrificial material, and at least one dielectric material. In some embodiments the dielectric material is a UV-curable photopolymer.

Description

RELATED APPLICATIONS [0001] This application claims benefit of U.S. Provisional Patent Application Nos. 60 / 533,932, 60 / 534,157, 60 / 533,891, and 60 / 574,733, filed on Dec. 31, 2003, Dec. 31, 2003, Dec. 31, 2003, and May 26, 2004. This application is a continuation in part of U.S. Non-Provisional Patent Application Nos. 10 / 841,300, and 10 / 607,931 filed on May 7, 2004 and Jun. 27, 2003, respectively. Each of the above noted priority applications are hereby incorporated herein by reference as if set forth in full.FIELD OF THE INVENTION [0002] The present invention relates generally to the field of Electrochemical Fabrication and the associated formation of three-dimensional structures (e.g. microscale or mesoscale structures). More particularly, it relates to the electrochemical fabrication methods that form structures on dielectric substrates and / or forms structures from layers that incorporate dielectrics. BACKGROUND OF THE INVENTION [0003] A technique for forming three-dimensional str...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(United States)
IPC IPC(8): B44C1/22C03C15/00C03C25/68C23F1/00C25D5/02C25D5/10H01L21/44H01L21/4763
CPCC25D5/022C25D5/10H01L21/7682H01L21/76838C25D1/003C23C18/1608C23C18/165C23C18/405C23C18/1605
Inventor COHEN, ADAM L.LOCKARD, MICHAEL S.KIM, KIEUNLE, QUI T.ZHANG, GANGFRODIS, URIMCPHERSON, DALE S.SMALLEY, DENNIS R.
Owner MICROFAB
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products