Utilizing clock shield as defect monitor
a clock shield and defect monitor technology, applied in short-circuit testing, instruments, measurement devices, etc., can solve problems such as initial test failur
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[0017] The present invention and the various features and advantageous details thereof are explained more fully with reference to the nonlimiting embodiments that are illustrated in the accompanying drawings and detailed in the following description. It should be noted that the features illustrated in the drawings are not necessarily drawn to scale. Descriptions of well-known components and processing techniques are omitted so as to not unnecessarily obscure the present invention. The examples used herein are intended merely to facilitate an understanding of ways in which the invention may be practiced and to further enable those of skill in the art to practice the invention. Accordingly, the examples should not be construed as limiting the scope of the invention.
[0018] In this invention the hardwired bias to the shields is replaced with a circuit which can optionally tie the shields to ground or let them float based on a test control signal. In the tied-down state, the shields pro...
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