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Sensor, multichannel sensor, sensing apparatus, and sensing method

a multi-channel sensor and sensor technology, applied in the field of sensors, multi-channel sensors, sensing apparatuses, and sensing methods, can solve the problems of difficult simultaneous analysis of multiple specimens, high cost of the plasmon sensor described above, and inability to accurately measure the plasmon sensor

Inactive Publication Date: 2009-08-27
FUJIFILM CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The sensor achieves higher detection sensitivity and allows for accurate analysis of specimens by utilizing multipath interference and local plasmon resonances, enabling simultaneous analysis of multiple specimens with reduced structural complexity and cost.

Problems solved by technology

The plasmon sensor described above is expensive, since it requires the prism-shaped dielectric block.
Further, it has many structural constraints, so that down-sizing of the sensor or simultaneous analysis of multiple specimens is difficult.

Method used

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  • Sensor, multichannel sensor, sensing apparatus, and sensing method
  • Sensor, multichannel sensor, sensing apparatus, and sensing method
  • Sensor, multichannel sensor, sensing apparatus, and sensing method

Examples

Experimental program
Comparison scheme
Effect test

first embodiment

of the Sensor

[0080]Hereinafter, the sensor according to a first embodiment of the present invention will be described with reference to FIGS. 1A, 1B, 1C. FIG. 1A is a perspective view, FIG. 1B is a cross-sectional view in thickness direction (taken along the line A-A in FIG. 1), and FIG. 1C is a drawing illustrating example spectra of the output light of the sensor.

[0081]As shown in FIGS. 1A, 1B, the sensor S1 of the present embodiment has a device structure in which the following components are arranged from the input side of the measuring light L1 (upper side in FIG. 1B) in the order listed below: a first reflector 10 having semi-transmissive and semi-reflective properties; a translucent body 20; and a second reflector 30 having perfect reflection properties. Either single wavelength light or broad light may be used as the measuring light L1, which is selected according to the physical properties to be detected.

[0082]The translucent body 20 is constituted by a translucent planar s...

second embodiment

of the Sensor

[0117]Hereinafter, the sensor according to a second embodiment of the present invention will be described with reference to FIGS. 2A and 2B. FIG. 2A is a cross-section view corresponding to FIG. 1B of the first embodiment. FIG. 2B shows example spectra of the output light. In the present embodiment, components identical to those of the first embodiment are given the same reference symbols and will not be elaborated upon further here.

[0118]As shown in FIG. 2A, the sensor S2 according to the present embodiment has a device structure that includes the following arranged from the input side of the measuring light L1 in the order listed below: the first reflector 10; translucent body 20; and second reflector 30 as in the first embodiment. The present embodiment differs from the first embodiment in that the second reflector 30 is constituted by a metal pattern layer having thin metal wires 31 formed in a regular lattice pattern as in the first reflector 10, and has semi-trans...

third embodiment

of the Sensor

[0125]Hereinafter, the sensor according to a third embodiment of the present invention will be described with reference to FIGS. 3A and 3B. FIG. 3A is a perspective view corresponding to FIG. 1A of the first embodiment. FIG. 3 is a top view of the sensor. In the present embodiment, components identical to those of the first embodiment are given the same reference symbols and will not be elaborated upon further here.

[0126]As shown in FIG. 3A, the sensor S3 according to the present embodiment has a device structure that includes the following arranged from the input side of the measuring light L1 in the order listed below: the first reflector 10 having semi-transmissive and semi-reflective properties; translucent body 20; and second reflector 30 having perfect reflection properties as in the first embodiment.

[0127]The present embodiment differs from the first embodiment in that the first reflector 10 is constituted by a metal particle layer having a plurality of metal par...

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Abstract

A new and novel sensor having a simple structure with high detection sensitivity. The sensor (S1) includes the following from measuring light (L1) input side in the order listed below: a first reflector (10) having semi-transmissive and semi-reflective properties; a translucent body (20); and a second reflector (30) having perfect reflection properties, or semi-transmissive and semi-reflective properties. The first reflector (10) and / or second reflector is brought into contact with a specimen, and the average complex refractive index varies with the specimen. Absorption properties for absorbing light having a particular wavelength are produced by these components, the properties of the measuring light (L1) are changed by the optical properties including the absorption properties, the output light (L2) is outputted from the first reflector (10) and / or second reflector (30), and the physical properties of the output light (L2) that vary according to the optical properties are detected.

Description

TECHNICAL FIELD[0001]The present invention relates to a sensor in which measuring light is inputted and outputted therefrom as output light after the physical properties thereof are changed by a specimen, and detected. It also relates to a multichannel sensor, a sensing apparatus, and a sensing method using the same.BACKGROUND ART[0002]As one of the sensors used for biomolecular analysis or the like, a sensor that makes use of the phenomenon in which the light intensity of the reflected light having a particular wavelength is attenuated by surface plasmon resonance is proposed, and a surface plasmon sensor basically constituted by a prism-shaped dielectric block, and a metal film formed on the block, and brought into contact with the specimen is disclosed, for example, in Japanese Unexamined Patent Publication No. 6 (1994)-167443. In the sensor, total reflection occurs at the interface between the dielectric block and the metal film. When testing a specimen, measuring light is irrad...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G01B9/02
CPCB82Y20/00C25D1/10C25D11/04G01N21/253G01N21/45G01N21/554G02B19/0028G01N2021/7776G01N2021/7779G01N2021/7789G02B17/0856G02B19/0085G01N2021/7773
Inventor NAYA, MASAYUKITANI, TAKEHARU
Owner FUJIFILM CORP