Method and apparatus for reducing stress across capacitors used in integrated circuits
a technology of integrated circuits and capacitors, applied in the direction of electric variable regulation, process and machine control, instruments, etc., can solve the problems of components or circuitry in these integrated circuits or systems require higher voltages to operate or function, and can exceed the stress or breakdown voltage limitation of a single capacitor
Inactive Publication Date: 2010-04-13
INTEL CORP
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Problems solved by technology
However, some components or circuitry in these integrated circuits or systems require higher voltages to operate or function.
However, the required voltage levels at some stages, especially the final stages of the charge pump circuit, can exceed the stress or breakdown voltage limitation of a single capacitor used for storing and transferring charge.
If the stress or breakdown voltage limitation of the single capacitor is exceeded, the maximum voltage level generated at those pump stages will be limited.
However, using two or more capacitors connected in series increases the die area of the charge pump circuit.
Therefore it is not desirable to use any more capacitors in the charge pump circuit than the number that is required for the circuit to function properly.
Method used
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[0016]In the following detailed description numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, it will be obvious to one skilled in the art that the present invention may be understood and practiced without these specific details.
[0017]In the discussion below, the teachings of the present invention are utilized to implement a method and apparatus for dynamically controlling the voltage level across the capacitors used in an integrated circuit so that the breakdown voltage of each individual capacitor will not be exceeded. In addition, the teachings of the present invention are also utilized to implement a method and an apparatus to effectively and efficiently balance between the performance requirements with respect to the output voltage levels, the stress or voltage breakdown limitations on the capacitors, and the die area of the integrated circuit. In one embodiment, the maximum voltage across a first node and a ...
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A method, apparatus, and system for controlling the voltage levels across capacitors coupled between a first node and a second node of an integrated circuit so that the voltage levels across these capacitors will not exceed the breakdown voltage limitation of these capacitors. The voltage level between the first and second nodes of the integrated circuit can vary from a second voltage level to a first voltage level when the integrated circuit transitions from a second power state to a first power state, respectively. A first capacitor and a second capacitor are connected in series between the first and second nodes of the integrated circuit forming a middle node between the first and second capacitors. The voltage level of the middle node is set to a third voltage level when the integrated circuit is placed in the first power state such that the voltage level between the first and middle nodes does not exceed the breakdown voltage of the first capacitor and the voltage level between the middle and second nodes does not exceed the breakdown voltage of the second capacitor.
Description
FIELD OF THE INVENTION[0001]The present invention relates to the voltage control in integrated circuits and devices. More specifically, the present invention relates to an apparatus, method, and system for controlling the voltage levels across the various capacitors used in integrated circuits so that the voltage levels across these capacitors do not exceed the stress limitation or breakdown voltage limitation of these capacitors.BACKGROUND OF THE INVENTION[0002]As integrated circuits and systems continue to advance and become more complex, effective and efficient power and thermal management of the integrated circuits and systems have become more and more critical in circuit design and implementation. In order to reduce the power consumption in integrated circuits and systems, these circuits and systems have been designed to operate at lower voltage levels. For example, integrated circuits and systems have been designed to operate at voltage levels such as 5 volts, 3.3 volts, or le...
Claims
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Login to View More IPC IPC(8): H02M3/18H01L27/04H01L21/822H02M3/07
CPCH02M3/073H02M3/07
InventorGANESAN, RAMKARTHIKJUNGROTH, OWEN W.
OwnerINTEL CORP