Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Measuring method and measuring device for time resolution spectrum

A technology of time-resolved spectroscopy and measurement methods, applied in spectrum investigation and other directions, can solve the problems of low signal utilization rate and long measurement time, and achieve the effects of improving measurement efficiency, shortening measurement time, and low cost

Inactive Publication Date: 2008-06-04
BEIJING JIAOTONG UNIV
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The technical problem to be solved by the present invention is to overcome the low signal utilization rate and the long time required for measurement in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measuring method and measuring device for time resolution spectrum
  • Measuring method and measuring device for time resolution spectrum
  • Measuring method and measuring device for time resolution spectrum

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] As a specific implementation block diagram figure 1 As shown, under the excitation of Nd:YAG triple frequency 355nm wavelength pulse light source short pulse δ(t), the luminescence spectrum of the erbium-doped ZBLAN glass sample changes and decays rapidly. After the luminescence is frequency-selected by the monochromator, a specific wavelength is obtained The attenuated optical signal I(λ i , t), and then transformed into electrical attenuation signal F(λ i , t), and finally recorded by a digital oscilloscope, so that the attenuation curve F(λ i , t). When the attenuation curve data is transmitted to the computer, the computer controls to change the output wavelength of the monochromator, and then the system performs a new attenuation curve measurement. figure 2 Attenuation curves at a range of wavelengths measured in erbium-doped ZBLAN glass samples. The data transformation of these decay curves is performed by the computer, and the luminous intensity of each wave...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The ivnention discloses a new method of new measuring apparatus for measuring time differentiating spectrum which are parallel at time. Light signal travels across monochromator, transformed into electric signal by photomultiplier, attenuation curves with the wavelength can be recorded conveniently by digital storage oscillograph, the data recording attenuation curves with different wavelength is disposed to acquire time differentiating spectrum by assembling luminous intensity of different wavelength at the same attenuation time. Its properties are measuring parallel at time, so that measuring time is shorten greatly and measuring efficiency is increased, besides, oscillograph is fairly usual laboratory apparatus, present apparatus being used fully and decreasing cost.

Description

technical field [0001] The present invention relates to a method for measuring spectra, in particular to a method for measuring time-resolved spectra, and at the same time, the present invention also relates to a measuring device for measuring time-resolved spectra. Background technique [0002] The luminous intensity of the luminescent material after short pulse excitation is a function of wavelength and time. Measuring the transient process is actually measuring the luminous intensity I(λ, t) as a binary function of wavelength and time. Understanding and studying this transient process can be done by measuring the fixed wavelength λ i The change of luminous intensity with time I(λ i , t) or measure a fixed delay time t j The spectrum I(λ,t j ) to achieve. I(λ i , t) is called the decay curve, I(λ, t j ) is called a time-resolved spectrum. [0003] The generation, movement and interaction of elementary excitations in materials give rise to various physical processes,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/30G01J3/28
Inventor 黄世华梁春军崔尚科
Owner BEIJING JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products