Self-correcting method for optical grating based on linear phase position
A self-correcting, straight line technology, applied in the direction of optical devices, measuring devices, instruments, etc., can solve the problems of increasing the difficulty of finding fringes, inaccurate measurement accuracy of grating waveform phase shift, and low density of measuring points
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2007-11-07
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention belongs to the technical field of three-dimensional information reconstruction, and mainly relates to a method for self-correction of projection grating through linear phase correction by combining Gray code and phase shift method in a three-dimensional scanning system in reverse engineering, in particular to a method based on linear phase Grating self-calibration method. Background technique
[0002] When the grating is projected onto the surface of the object, the phase of the periodic grating is modulated by the height profile of the object surface, forming a deformed grating, which carries the three-dimensional information of the object. Accurately obtaining the phase information modulated by the height of the object and performing phase unwrapping is the core of the fringe image automatic analysis technology, which plays a key role in obtaining the three-dimensional information of the object. The sinusoidality and precise phase shif...
Examples
Embodiment Construction
[0055] The specific implementation manners of the present invention will be further described below in conjunction with the drawings. According to the above method, the grating self-calibration operation is realized by using C++ programming on the VC++6.0 platform in the Windows operating system.
[0056] Firstly, each factor is analyzed from the perspectives of grating sine, precise phase shift, and periodicity, and targeted improvement methods and measures to improve accuracy are put forward to provide a basis for the final grating self-correction method; and in grating projection In the measurement, the main problem affecting the measurement accuracy is the projection technology. The projection in the grating projection measurement requires high contrast, intensity and good light intensity mode. Therefore, we can evaluate the accuracy of phase-shift grating projection measurement from the perspective of the sine and periodicity of the projected grating waveform, and convert...