Method for producing magnetic multilayer film
A manufacturing method and multilayer film technology, applied in the direction of magnetic thin film, application of magnetic film to substrate, manufacture/processing of electromagnetic devices, etc., can solve problems such as hindering the function of magnetic multilayer film
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Publication Date
- 2010-05-26
Smart Images
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Abstract
Description
technical field
[0001] The invention relates to a method for manufacturing a magnetic multilayer film, which is suitable for forming a film used to form a giant magnetoresistance (Giant Magnetic Resistive, GMR) spin valve or a tunneling magnetoresistance (Tunneling Magnetic Resistive, TMR) element The giant magnetoresistance spin valve is used to form a magnetic head, and the tunnel magnetoresistance element is used to form a magnetic random access memory (Magnetic Random Access Memory, MRAM).
[0002] This application claims the priority of Japanese Patent Application No. 2005-000403 filed on January 5, 2005, the content of which is incorporated herein. Background technique
[0003] Recently, an MRAM under development has a tunnel junction element composed of a TMR film.
[0004] Figure 8A is a side sectional view of the tunnel junction element. The tunnel junction element 10 is formed by laminating a first magnetic layer (pinned layer) 14 , a nonmagnetic layer (tunnel b...
Examples
Embodiment Construction
[0047] Embodiments of the present invention will be described below in conjunction with the accompanying drawings. In addition, in each drawing used for explanation below, in order to make the size of each component recognizable, the scaling ratio of each component is appropriately changed.
[0048] (Magnetic multilayer film)
[0049] First, a tunnel junction element including a TMR film, which is an example of a multilayer film including a magnetic layer, and an MRAM including the tunnel junction element will be described.
[0050] figure 1is a side sectional view of the tunnel junction element. In the tunnel junction element 10 , an underlayer 12 is formed on the surface of the substrate 5 . The base layer 12 includes a first base layer 12a composed of Ta or the like and a second base layer 12b composed of NiFe or the like. An antiferromagnetic layer 13 composed of PtMn, IrMn, or the like is formed on the surface of the base layer 12 . The second base layer 12 b has a ...