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Method for producing metal/semiconductor contacts through a dielectric

A technology of semiconductor and dielectric layers, applied in the field of forming semiconductor devices, can solve the problems of damage to metal surface batteries, inability to have good productivity, long formation time, etc.

Inactive Publication Date: 2008-01-30
COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The main disadvantage of this method is that it cannot have good productivity
In fact, the laser has to form 100 to 500+ melting points on each cell, which requires a long formation time
In addition, the laser can damage the metal surface (causing the backside of the cell to be too thick), which is the reason for the damage that occurs during the interconnection between several cells

Method used

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  • Method for producing metal/semiconductor contacts through a dielectric
  • Method for producing metal/semiconductor contacts through a dielectric
  • Method for producing metal/semiconductor contacts through a dielectric

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Embodiment Construction

[0046] Referring to FIG. 1 , which is a cross-sectional view illustrating an embodiment of a semiconductor device 100 formed according to a forming method that is an object of the present invention. This component comprises a dielectric layer 4 on at least one face 2 of a semiconductor substrate 1 called "base". A metal layer 5 is stacked on this dielectric layer 4 . The semiconductor device 100 also comprises contacts 6.1 to 6.n between the metal layer 5 and the semiconductor substrate 1 through the dielectric layer 4 formed according to a formation method for the purpose of the present invention. In Fig. 1 only four contacts 6.i-1, 6.i, 6.i+1, 6.i+2 of the series of contacts 6.1 to 6.n are shown. In this embodiment a solar cell is involved, but it could be another semiconductor device.

[0047] The semiconductor substrate 1 may be a crystalline substrate, for example in the form of monocrystalline silicon or polycrystalline silicon. The semiconductor substrate 1 may also ...

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Abstract

The invention relates to a method for producing contacts (6.1 to 6.n) between at least one metallic layer (5) and at least one semiconductor substrate (1) through at least one dielectric layer (4) in a semiconductor device (100). Said semiconductor device (100) comprises the dielectric layer (4) on at least one face (2), the so-called base of the semiconductor substrate (1). The metallic layer (5) is stacked on the dielectric layer (4). Heated ends of a plurality of projecting elements (13.1 to 13. n) mounted on a support (12) are simultaneously brought into contact with the metallic layer (5), thus creating regions of molten metal (14.1 to 14. n) under the heated ends of the projecting elements (13.1 to 13. n). The molten metal passes through the dielectric (4) and merges with the semiconductor of the substrate (1) in the molten metal regions (14.1 to 14. n), thus creating the contacts (6.1 to 6.n).

Description

technical field [0001] The present invention relates to a method of forming metal / semiconductor contacts through a dielectric, and is particularly suitable for forming semiconductor devices. This method can be used, for example, to form metal / semiconductor contacts on the rear side of a homojunction solar cell. Background technique [0002] The manufacture of industrial-grade solar cells pursues two goals: increasing the efficiency of solar cells and increasing the productivity of manufacturing these solar cells. Most solar cells manufactured are based on crystalline silicon. Solar cells can be divided into two categories: heterojunction solar cells and homojunction solar cells. [0003] The traditional method of manufacturing crystalline silicon homojunction solar cells is as follows: [0004] A silicon substrate doped with N or P is placed in a diffusion furnace so that on one side of the substrate a region doped with P+ is formed when the silicon is doped with N, or a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0224H01L27/142H01L31/18H01L21/28
CPCH01L31/02008H01L31/022425Y02E10/50
Inventor 皮埃尔·吉恩·里贝龙埃马纽埃尔·罗兰
Owner COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
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