Polarization phase shifting double shearing interference wave face measuring apparatus and inspect method thereof
A double shear, measuring instrument technology, applied in polarizing elements, measuring optics, measuring devices, etc., can solve the problems of difficult to measure accurately, cannot give the three-dimensional shape of the wavefront, etc., and achieve the effect of high sensitivity
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[0018] Please refer to FIG. 1 first. FIG. 1 is a schematic structural diagram of an embodiment of the polarization phase-shifting double-shear interferometric wavefront measuring instrument of the present invention. As shown in Figure 1, the polarization phase-shifting double-shear interference wave surface measuring instrument of the present invention consists of a first Yamin parallel plate 1, a wedge-shaped optical plate 2 on the left, an optical plate 3 on the left, a wedge-shaped optical plate 4 on the right, and an optical plate 5 on the right. , The second Yamin parallel plate 6, a quarter wave plate 7, an analyzer 8, an imaging mirror group 9, a CCD image sensor 10 and a computer 11.
[0019] The material and thickness of the first Yamin parallel plate 1 and the second Yamin parallel plate 6 are the same. The working face A of the first Yamin parallel plate 1 is the incident working face, and the polarizing beam splitting film is coated on the working face A, and the p...
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