Test pin free contact type CPU card test method

A contact and card testing technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of high test circuit safety and low test cost, and achieve the effect of saving area and improving safety.

Inactive Publication Date: 2008-04-30
BEIJING CEC HUADA ELECTRONIC DESIGN CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

With the gradual development of the industry, the testing work is not only required to accurately screen out good products, but more importantly, the testing efficiency should be high, the testing cost should be low, and the safety of the testing c

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  • Test pin free contact type CPU card test method
  • Test pin free contact type CPU card test method

Examples

Experimental program
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Embodiment Construction

[0015] figure 1 It is the overall structure diagram of the present invention, and the connection relationship of each module is shown in the figure. Combine below figure 1 An embodiment of the present invention will be described in detail.

[0016] 1. Take a byte "F5H" as an example to introduce how it is written into the program memory:

[0017] In the test mode of the chip, a proprietary transmission protocol is used to serially input and write the corresponding addresses of "F5H" and "F5H" in the test program through the IO pins and write them into the serial input register group (1). After all the relevant bits of the "F5H" write operation are written into (1), the test circuit will generate a flag signal, and when the chip detects that the flag signal is valid, it will write all the data in (1) to the corresponding in parallel register bank (2).

[0018] At this time, the erasing control signal of "F5H" in (2), the data and the corresponding address are sent in accord...

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Abstract

The invention provides a contact-type method for testing a CPU card of which the program memory is the electrical erasable memory without testing pin. The method carries out erasing function to the program memory by loading an erasing control signal to the program memory, an erasing address and a data string through the IO pin of the IC card. Thus, the function testing program of the chip can be loaded and written into the program memory through an IO string, and the function testing to the chip can be carried out by operating the function testing program in the program memory. In the testing method, the testing pin is shared with the standard pin of the IC card, thus the separate chip testing pin is not added, so as to improve the safety of the chip and reduce the area of the chip.

Description

technical field [0001] The invention is mainly applied to the test circuit of the contact type CPU card in which various program memories are electrically erasable and rewritable memories. Background technique [0002] With the advent of the digital society, more and more electronic products of various types are used in life. IC card is an electronic product closely related to people's daily life. SIM card, bank card, ID card, etc. Then, for such a mass-produced card product, it needs to pass a series of tests to ensure the correct function and performance of the product before it is finally handed over to the user. As the designer of the chip, the first thing that should be guaranteed is the correctness of the hardware function of the chip. Then it is necessary to have such a test method to screen out the products that meet our design requirements from the chips processed in the factory and provide them to users. [0003] In order to meet the detection of good chips in m...

Claims

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Application Information

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IPC IPC(8): G06F11/267G06F21/02G01R31/3185G06F21/57
Inventor 张海峰
Owner BEIJING CEC HUADA ELECTRONIC DESIGN CO LTD
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