Manufacturing method for devices
一种器件制造方法、器件的技术,应用在器件制造领域,能够解决器件破损等问题
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[0027] Preferred embodiments of the method for breaking an adhesive film attached to a wafer according to the present invention will be described in detail below with reference to the drawings.
[0028] exist figure 1 In , a perspective view of a semiconductor wafer as a wafer is shown. figure 1 The shown semiconductor wafer 2 is made of, for example, a silicon wafer with a thickness of 80 μm, and a plurality of dividing lines 21 are formed in a grid pattern on the surface 2 a. Furthermore, on the surface 2 a of the semiconductor wafer 2 , devices 22 such as ICs and LSIs are formed in a plurality of regions divided by a plurality of dividing lines 21 formed in a lattice.
[0029] On the back surface 2b of the above-mentioned semiconductor wafer 2, as figure 2 The adhesive film 3 for die bonding is attached as shown in (a) and (b) (adhesive film attaching process). At this time, while heating at a temperature of 80 to 200° C., the adhesive film 3 is press-mounted onto the b...
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