Wavelet transform signal frequency spectrum measuring analytical method adopting variable band-width parameter

A wavelet transform, measurement and analysis technology, applied in the field of signal spectrum measurement and analysis, can solve the problems of wavelet transform frequency resolution decrease, frequency band widening, frequency difficult to distinguish, etc.

Inactive Publication Date: 2008-11-19
吴伟
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  • Summary
  • Abstract
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  • Claims
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Problems solved by technology

[0004] However, if wavelet transform is used for signal spectrum analysis to overcome the weakness that Fourier transform cannot be used for transient and non-periodic signal analysis, the above-mentioned advantages of automatic resolution adjustment of wavelet transform become disadvantages: as the measurement frequency increases , the frequency resolution of the wavelet transform gradually decreases, and the frequency band gradually widens
Because wavelet transform averages all frequency components in the frequency band, it makes it difficult to distinguish the frequency at the high end of the spectrum, which hinders the application of wavelet transform in signal spectrum measurement and analysis.

Method used

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  • Wavelet transform signal frequency spectrum measuring analytical method adopting variable band-width parameter
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  • Wavelet transform signal frequency spectrum measuring analytical method adopting variable band-width parameter

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Embodiment

[0044] Embodiment: In this embodiment, an oscilloscope is used to record the voltage signal generated by the signal generator. Those skilled in the art know that these oscilloscopes and signal generators can use various types of products sold in the market. Then, the frequency spectrum of the recorded signal is analyzed by adopting the existing technology and the technology of the present invention, so as to verify the technical effect after the improvement.

[0045] Such as figure 1 Shown in, the concrete method step of the present invention is:

[0046] Use an oscilloscope to measure and record the mixed signal generated by the signal generator. The signal includes sinusoidal signals of 60Hz, 180Hz, 300Hz, 420Hz, 660Hz, 780Hz and 1020Hz, as expressed in formula (11):

[0047] S ( t ) = 1.0 2 sin ( 2 π 60 ...

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Abstract

Disclosed is a method for measuring and analyzing signal spectra, which can make a frequency spectrum analysis of transient and non-periodic signals and still keep a better frequency resolution at the high frequency part of the signal spectra by adopting variable bandwidth parameters in the Morlet wavelet transform. The method comprises the following steps of: recording the measured and analyzed signals firstly, then calculating the wavelet transform with variable bandwidth parameters of the measured and analyzed signals, then summing wavelet transform coefficients at different frequency points along a time axis and calculating the average value, and finally obtaining the frequency spectrum curve of the measured and analyzed signals.

Description

technical field [0001] The invention relates to a signal spectrum measurement and analysis method, in particular to a signal spectrum measurement and analysis method using MORLET continuous wavelet transform. Background technique [0002] In recent years, with the increase of the clock frequency of digital circuits, the jitter, transient and aperiodicity of the signal make the traditional signal spectrum measurement and analysis technology, Fourier Transform (FOURIER TRANSFORM), difficult to meet the requirements. Because the Fourier transform assumes that the signal to be measured and analyzed is periodic and steady-state, even if a certain signal mutation occurs only once, the Fourier transform assumes that it must reappear forever, resulting in a large measurement and analysis error. [0003] The wavelet transform, because it uses a set of generative functions of different widths to measure the tested signal, is suitable for both periodic signals and transient and non-per...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/16G01R13/00
Inventor 吴伟
Owner 吴伟
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