Low stray light rapid spectrometer and measurement method thereof

Abstract

The invention discloses a low-stray-light fast spectrometer and a measurement method thereof. The spectrometer includes a light signal collection mechanism and an optical platform and is characterized in that the optical platform includes a bandpass color wheel; a group of bandpass color filters and via-holes are arranged on the bandpass color wheel; and an incident light reaches a dispersive element through the bandpass color filters or the via-holes, is split and then received by an array detector. Through rotation of the bandpass color wheel, the incident light scans the bandpass color filters one by one, and the spectrometer accurately detects a sample to be detected segment by segment to correspond to a response function. When a similar sample with similar spectral characteristics ismeasured, the sample is accurately detected segment by segment and is subjected to full-spectrum fast detection through the via-holes, the stray light correction factor can be calculated according tothe two measurement results, and the similar sample is subjected to the full-spectrum fast detection and is corrected by the stray light correction factor to achieve fast accurate detection. The method can effectively reduce the measurement stray light of the fast spectrometer and fast accurately measure the spectrum curves and related spectroradiometric parameters of the sample with similar spectral characteristics.

Description

【Technical field】 [0001] The invention belongs to the field of spectral radiation testing, and in particular relates to a fast spectrometer and a measuring method thereof. 【Background technique】 [0002] Spectrometers are used to measure the spectral power distribution of light, and are widely used in color measurement, element identification, chemical analysis and other fields. The stray light level is an important parameter in the spectrometer. The so-called stray light refers to the signal generated by the light radiation of the wrong wavelength (not corresponding to the signal light wavelength) irradiating the detector pixel. This parameter is very important for all applications of the spectrometer. Important, especially in the following cases, its influence on the measurement results is more prominent: [0003] The measured sample has a linear spectral emission or there are a large number of non-radiative power distribution areas in the measured wavelength range. If th...

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Problems solved by technology

The simplest improvement method is to use a band-pass color filter to reduce the spectral components. In addition, the double monochromator method can achieve higher accuracy, but the current color filter and double monochromator methods are mainly used in mechanical scanning spectrometers , how to apply it in a fast spectrometer using an array detector seems to be very difficult, which also makes one of the indicators of stray light control a limitation of the fast spectrometer

[0007] The current method of reducing stray light in fast spectrometers using array detectors is to use long-pass filters on some pixels of the array detectors. This method has limitations: first, only use filters at the receiving end of the scattered light The optical sheet cannot effectively prevent the generation of stray light when the incident beam propagates in the optical table; secondly, although the long-pass filter limits the high-order diffracted light to a certain extent, it is not suitable for the short-wave energy such as the standard A light source. Weak and strong spectral distribution in the long-wave part, the stray light in the long-wave part will bring great errors to the measurement of the short-wavelength part, thus affecting the calibration or measurement results

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