The invention discloses a test conversion clamp for a photoelectric device. The test conversion clamp comprises clamp pins, a lower bottom plate, a middle interface plate, a spring piece and an upper cover plate, the middle interface plate is fixedly installed on the lower bottom plate, the middle interface plate is provided with a groove used for installing a device to be tested, the spring piece is fixed at the bottom of the groove, one end of the clamp pin is connected with the spring piece, and the other end of the clamp pin extends to the outside of the lower bottom plate; one end of the upper cover plate is rotatably connected with the middle interface plate, a to-be-tested device is arranged in a groove formed in the middle interface plate, the upper cover plate presses the to-be-tested device, meanwhile, the leading-out end of the to-be-tested device presses the spring piece, the to-be-tested device is connected with the clamp pin through the spring piece, and the cover plate is provided with a light window corresponding to the to-be-tested device. Light emitted by the light source reaches the to-be-tested device through the light window. The switching clamp is simple in structure, rapid to install, convenient to disassemble, wide in applicability, capable of effectively improving the testing efficiency, high in stability and capable of effectively improving the testing yield.