107results about How to "Large measurement dynamic range" patented technology

The invention relates to an optical spectrometer and a calibration method thereof. The optical spectrometer comprises a monochromator used for dividing the measured light into monochromatic lights, a photomultiplier used for receiving the monochromatic lights; the monochromator and the photomultiplier are optically connected. The photomultiplier is electrically connected with a microcontroller by a signal processing circuit. The optical spectrometer is characterized by further comprising a reference light source used for creating reference light; the reference light source which is alight-emitting diode is connected with the micro-controller. Compared with the prior art, the optical spectrometer and the calibration method thereof have the advantages as follows: 1. reasonable design, simple structure and large measuring dynamic range are ensured; 2. the absolute sensitivity of the photomultiplier is reasonably calibrated, therefore, the response linearity of the optical spectrometer is good; 3. thermostatic control is carried out to a reference detector, the reference light source and the photomultiplier, thus effectively enhancing the work stability of the optical spectrometer; and 4. the performance of the optical spectrometer is substantially enhanced under the condition that a small amount of cost is increased.

The invention discloses a micro-accelerometer and a preparation method thereof, belonging to the technical field of processing micro inertia devices. The micro-accelerometer is arranged on a package substrate which is formed by stacking an upper surface plate, a lower surface plate and a plurality of middle substrates, wherein a signal detection circuit of the micro-accelerometer is attached on the upper surface plate; a sensitive element of the micro-accelerometer is embedded in the middle substrates, i.e. the middle substrates with cavities form a frame of the sensitive element; a flexible hanger and a sensitive mass block of the sensitive element are arranged in the cavities, and one end of the flexible hanger is connected with the sensitive element, while the other end is fixed on the frame; metal electrodes are respectively sputtered on the sensitive mass block and the surface of the frame corresponding to the sensitive mass block so as to form a flat plate sensitive capacitor, or a metal piezoresistive thick-film pattern is deposited at a connecting part of the flexible hanger and the inner side surface of the frame so as to form a metal piezoresistive strain gauge. The micro-accelerometer has high sensitivity and high-temperature resistance and can be fused into a whole with a system level package substrate, thus the micro-accelerometer has low processing difficulty and cost.

The invention provides a laser far field focal spot measurement method based on orthogonal light wedge dichroism and a focal spot reconstruction algorithm. A measurement apparatus used in the method comprises a pair of orthogonal light wedges, a focusing lens, a CCD imaging device and a computer system. Beam splitting is performed to an incident laser beam through two light wedge device whose wedge angle directs to a mutually orthogonal direction and the incident laser beam is converged through the focusing lens. After that, the incident laser beam forms sub-spot array with successively damped peak strength on a CCD photosensitive surface in a lens plane. An effective method is used to carry out splicing fusion on each of the measured sub-spot. And finally, complete laser far field focal spot intensity distribution can be obtained through reconstruction. According to the invention, CCD dynamic measurement range can be greatly developed; a lot of high-frequency side-lobe information of the actual focal spot can be extracted from CCD background noise so that accurate measurement and light beam quality evaluation can be possibly achieved.

The invention belongs to the field of non-contact optical measurement of geometrical quantities, and particularly relates to a non-contact measurement method for geometric parameters of an optical part and a measuring device thereof. The invention aims to overcome the defects of low speed, small dynamic range for measurement, high cost and inapplicability to on-line quick measurement in the priorart. In order to overcome the defects, the technical scheme provided by the invention is a non-contact measurement method for geometric parameters of an optical part, which comprises the following steps: modulating the collimated light by using an electric scanning optical switch to form annular collimated light, converging the collimated light through an axicon lens (Fresnel lens) to realize convergent points at different distances, collimating by utilizing the convergent points and identifying the surface of the optical part, thereby measuring the geometrical thickness and motion distance of the optical part and the center height of the optical lens. The invention has the advantages of low cost, high stability, simple instrument structure and easy processing, is suitable for quick on-line measurement, and can realize wider dynamic measurement range compared with spectral scanning instruments.

The present invention discloses a pentaprism scanning detection method for an aspheric reflector. The method comprises: 1) arranging a device required for detection; 2) performing scanning detection of a single bus; 3) performing scanning detection of the next bus of the rotation angle a of the aspheric reflector after the scanning of the single bus is completed; and 4) performing detection data processing and fitting. All the angle differences are transited to the slope values of the corresponding positions of the reflective surface of the aspheric reflector, the slope values are fitted with the Zernike gradient polynomial, and the low-order surface-shaped error parameters of the aspheric reflector are obtained. The high-precision low-order surface-shaped error parameters of the aspheric reflector can be obtained.

The invention relates to a common-optical path polarization point diffraction phase-shift interference wavefront sensor, which comprises a polaroid, a first double refraction lens, a second double refraction lens, a phase-shift interference system, a CCD (Charge Coupled Device) sensor and a computer, as well as a polarization PDI (Point-diffraction Interferometer) mask plate provided with a needle hole and additionally arranged at a confocal plane of the first and second double refraction lenses, wherein a linearly polarized light beam to be detected is divided into two beams by the first double refraction lens, E light is converged at the needle hole of the polarization PDI mask plate to be subjected to small hole diffraction so as to serve as reference light, and O light passes through the polarization PDI mask plate nearly without decrement to serve as testing light; the reference light and the testing light pass through the phase shift interference system to form a four-frame time or space phase shift interference figure; streak contrast gradient is adjusted through rotating the polaroid; and then a phase shift algorithm is adopted to re-establish a phase position of a wavefront to be detected. According to the invention, the wavefront sensor adopts a common-optical path, dispenses with special reference light, is strong in system stability and adjustable in streak contrast gradient, and is suitable for high-precision detection for dynamic and static stage of various wavefront phase positions.

The invention discloses a distributing photometer including two independent bases, a rotary arm which rotates around a horizontal rotary central line arranged on a first base, an ellipse circumrotate plane optical reflector, a first optical detector, a second optical detector and a second laser ejector are arranged on the rotary arm and rotates around the tested lighting source with the rotary arm, the tested lighting source can rotate around the own vertical axis, a vertical round or ellipse plane optical reflector is arranged on the second base; a lighting beam from the tested lighting source is reflected to the vertical optical reflector by rotating the optical reflector, normal incidence of the lighting beam on the first optical detector is reflected by the vertical optical reflector, tests of large and medium lamps and lanterns can be implemented with long distance; the second optical detector aims at the tested lighting source directly, thus implementing tests of small lamps and lanterns of short distance. The testing chamber of the invention occupies less space with high testing precision, no extra calibration or adjusting instrument is needed in implementing tests of diverse testing arm length (testing distance) by adopting different optical detectors.

The invention relates to an on-site verification apparatus for an optical fiber current sensor, a usage method of the on-site verification apparatus and application of the on-site verification apparatus. The on-site verification apparatus for the optical fiber current sensor includes an optical fiber current detection sensing module and an optical fiber current detection processing and display module. The optical fiber current detection sensing module is composed of a light source, a linear polariscope, a polarization separator, a modulator, a transmission optical fiber, a 1/4 wavelength filter, an optical fiber sensing head, a reflector and a photoelectric detector. Proceeding from installation and debugging of the optical fiber current detection sensing module, the optical fiber current sensor on-site verification apparatus has reasonable control steps, is easy to operate, and can carry out efficient, economic and accurate error detection and quantity transmission on a DC heavy current sensor working on site for a long time; the optical fiber current sensor on-site verification apparatus is suitable for detecting and verifying a current detection sensor working on site for a long time in fields of electrolytic aluminum, electrolytic copper, electric smelting, electroplate and other electrochemical engineering; the on-site verification apparatus for the optical fiber current sensor is good in safety performance, large in measuring dynamic scope, high in frequency response degree, small in size and light in weight; and by adopting the on-site verification apparatus for the optical fiber current sensor, the measuring precision of a current detection apparatus can be raised, and needs of safety and stabilization of a power supply system are met.

The invention discloses a mirror displacement measurement method based on feature pattern reflecting. A feature pattern is displayed on a display screen and projected to a mirror, and after reflected, the feature pattern is photographed with a CCD (charge coupled device) camera. The CCD camera photographs and records the reflected feature pattern, namely the CCD camera photographs and records a virtual image formed by the mirror on the display screen. When the mirror moves, the virtual image photographed by the CCD camera moves meanwhile. Inner and outer parameters of the CCD camera can be calibrated to obtain a displacement distance of the virtual image formed by movement of the mirror; according to the law of light reflection, the displacement distance of the mirror is half of that of the virtual image, and displacement of the mirror is obtained.

The invention discloses a fiber interference technology-based sleep health monitoring system and relates to the technical field of intelligent health monitoring. The fiber interference technology-based sleep health monitoring system is characterized by comprising a flexible structure in contact with human body, a narrow-linewidth semiconductor laser device, a fiber interference system and a signalmodulator, wherein the narrow-linewidth semiconductor laser device, the fiber interference system and the signal modulator are sequentially connected, and the fiber interference system is connected with the flexible structure; the fiber interference system is composed of a 2*2 coupler, a 3*3 coupler, two optical fibers, two reflectors and three photoelectric detectors and is connected in a Michelson mode or a Mach-Zehnder mode. The fiber interference technology-based sleep health monitoring system acquires external disturbance information by collecting and analyzing optical signals from threedifferent phases, analyzes and processes the three acquired optical signals through the signal modulator to acquire information during sleep of a user such as pressure, breath and heartbeat. The fiber interference technology-based sleep health monitoring system has the advantages of being high in sensitivity, resistant to electromagnetic interference, diversified in data acquisition and high in practicality.

The invention discloses a two-stage TDC circuit applied to process non-controlled detection. The TDC circuit comprises a first-stage annular delay chain TDC, a time margin selection circuit and a second-stage vernier type TDC. The first-stage annular delay chain TDC performs coarse quantization on input two paths of signals, and meanwhile, the measurement dynamic range is expanded by utilizing anannular structure; the time margin selection circuit transmits the time margin left after coarse quantization is carried out and less than one delay unit to a second stage for fine quantization; the second-stage vernier type TDC performs further fine quantization on the time margin left in a first stage by using two delay chains with different speed, and the measurement resolution can be adjustedthrough the difference value of the delay units on the two delay chains. According to the TDC circuit, the contradiction between the area and the dynamic range and the contradiction between the resolution and the design complexity in a traditional TDC circuit are effectively solved, and various requirements on the TDC circuit of process non-controlled detection of a large-scale digital integratedcircuit based on delay measurement can be met.

In order to solve the technical problems that the existing scheme for measuring the surface shape of the large-aperture planar optical element is easily influenced by air flow disturbance and vibration, the measurement dynamic range is small, the surface shape measurement resolution is not high, the scheme cannot be applied to surface shape measurement of various postures in place, and measurementcannot be performed when Power exists in the surface shape of the large-aperture planar optical element, the invention provides an in-situ surface shape splicing measurement device and method for a large-aperture plane optical element. A laser, a semi-transparent semi-reflective mirror, a collimator objective, a diaphragm, a small-hole diaphragm, a collimator eyepiece, a binary optical device, adetector, an attenuation plate, a far-field detector, a drive controller, an electric control diaphragm, a reflector array, a pyramid prism array and a six-degree-of-freedom motion platform are utilized, the dynamic high-precision surface shape splicing measurement of the measured large-aperture planar optical element under various postures is realized, and the measurement precision is not influenced by the external environment.

The invention relates to a bilateral multi-plane inclined wave surface interferometer. The system comprises a light source module, a first interferometer host, a second interferometer host, a double-sided standard flat plate, a double-sided standard flat plate adjusting frame, a measured non-transparent flat plate element, a single-point thickness measuring sensor and a control processing unit, wherein the first interferometer host and the second interferometer host are both multi-plane inclined wave surface interferometers. The interferometer is advantaged in that parallel measurement light in multiple directions is emitted through a point source array generator to measure the bilateral morphology and thickness of the measured non-transparent flat plate element, and the interferometer hasadvantages of being large in measurement dynamic range, high in measurement precision and efficiency, flexible in phase shift mode and capable of achieving in-situ calibration of system errors.

The invention discloses a thermally induced voltage material and application thereof, belonging to the technical field of transverse thermoelectric materials and devices. A (Ca/Sr) 3Co4O9 or (Ca/Na) xCoO2 (x=0. 52-0.8) thin film is selected as thermally induced voltage material in the present invention. As the thermal field or the thermal fluid induce voltage material of the invention has high signal response rate and does not need to establish heat balance, the response time is fast, and the signal repeatability and the linear relationship are good; the temperature gradient of the thermally induced voltage thin film is converted into a larger thermoelectric voltage signal by directly using heat source or thermal field heating, which has no time term, strong anti-interference ability, no power supply driving, no refrigeration and amplification, and can be used to fabricate some sensitive and fast thermally induced voltage detection devices. The temperature and thermoelectric potentialare perpendicular to each other, and can modulate dimension and direction independently. It is easy to fabricate arrays to detect transient thermal field or heat flux. Compared with the current devices, the material has great breakthrough and advantages, and can be used in the industrial and military fields of pulse or continuous thermal signal detection, transient thermal field and thermal fluiddetection.

Disclosed is a structured light method for small-angle measurement. A measuring system comprises a CCD camera, a display screen and a computer. A feature pattern is displayed on the display screen and projected onto a measured object or a reflector fixed on the object, and the pattern is reflected and then shot by the camera. The reflected feature pattern is shot by the CCD camera, and in other words, a virtual image formed through the reflector on the display screen is shot by the CCD camera. When the object rotates, the virtual image shot by the camera rotates too. The rotating angle of the virtual image can be calculated by analyzing the virtual image before and after rotation. According to the light reflection law, the rotating angle of the object is half of the rotating angle of the virtual image. The measuring system is simple in structure, convenient to use, high in sensitivity, free of special requirements for the environment, and capable of conducting detection in a workshop.