Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Two-stage TDC circuit applied to process non-controlled detection

An uncontrolled, circuit-based technology, applied in the direction of measuring time interval devices, electrical unknown time interval measurement, instruments, etc., can solve problems that do not meet the actual application conditions, the impact of conversion speed, difficult layout and wiring, etc., to reduce the design Effects of complexity, ease of adjustment, ease of measurement resolution

Active Publication Date: 2019-04-16
XIDIAN UNIV
View PDF5 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage of this method is that in the actual ASIC implementation process, the uniform ring design is not easy to implement layout and wiring. Both the rising edge and the falling edge are detected, the overall circuit area is large and the structure is complex
The disadvantage of this design is that the use of the time amplifier will affect the circuit design complexity, area, power consumption, and conversion speed.
And in our given application scenario, inserting multiple fully customized time amplifier units into a large-scale digital circuit does not meet the actual application situation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Two-stage TDC circuit applied to process non-controlled detection
  • Two-stage TDC circuit applied to process non-controlled detection
  • Two-stage TDC circuit applied to process non-controlled detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] See figure 1 , figure 1It is the overall block diagram of the two-stage TDC circuit of the present invention, and the two-stage TDC circuit applied to the process uncontrolled detection of the present invention includes a first-stage circular delay chain TDC, a time margin selection circuit and a second-stage vernier TDC.

[0045] The first-stage circular delay chain TDC circuit is electrically connected to the critical path of the circuit to be tested, and is used for performing first quantization processing on the time interval between signals at both ends of the critical path to determine the first delay time. The first-stage circular delay chain TDC circuit is mainly to roughly quantify the time interval of the two signals in the critical path and expand the measurement dynamic range of the overall circuit.

[0046] The critical paths involved in the present invention can be understood as some paths in an actual circuit where signals pass frequently and are crucial...

Embodiment 2

[0052] On the basis of Embodiment 1, please refer to the two-stage TDC circuit applied to process uncontrolled detection in this embodiment figure 2 , with figure 2 It is a structural block diagram of a first-stage circular delay chain TDC circuit according to an embodiment of the present invention. The first-stage annular delay chain TDC of the TDC circuit of the present invention comprises an annular delay chain, a first counting circuit and a second counting circuit; STATR and STOP signals are respectively used as the input of the annular delay chain and the second counting circuit, and The outputs of the delay chain are electrically connected to the first counting circuit and the second counting circuit respectively.

[0053] See image 3 , image 3 It is the structural refinement frame of the first-stage circular delay chain TDC circuit of the embodiment of the present invention Figure 1 . image 3 In , the circular delay chain is composed of a two-input NAND gate...

Embodiment 3

[0063] The two-stage TDC circuit applied to process uncontrolled detection in this embodiment is further described in detail on the time margin selection circuit and the second-stage vernier TDC circuit on the basis of the above embodiments.

[0064] See Figure 10 , Figure 10 It is a schematic diagram of the circuit structure of the time margin selection circuit of the two-stage TDC circuit of the present invention. The time margin selection circuit includes a delay unit group, an SEL decoding circuit and a multiplexer; wherein, the delay unit group is electrically connected to the first-stage circular delay chain TDC circuit and the multiplexer, and is used for starting from the first-stage circular The delay chain TDC circuit receives the remaining time margin information and delays the time margin information and sends it to the multiplexer for selection and output; the SEL decoding circuit is electrically connected to the first-stage circular delay chain TDC circuit and...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a two-stage TDC circuit applied to process non-controlled detection. The TDC circuit comprises a first-stage annular delay chain TDC, a time margin selection circuit and a second-stage vernier type TDC. The first-stage annular delay chain TDC performs coarse quantization on input two paths of signals, and meanwhile, the measurement dynamic range is expanded by utilizing anannular structure; the time margin selection circuit transmits the time margin left after coarse quantization is carried out and less than one delay unit to a second stage for fine quantization; the second-stage vernier type TDC performs further fine quantization on the time margin left in a first stage by using two delay chains with different speed, and the measurement resolution can be adjustedthrough the difference value of the delay units on the two delay chains. According to the TDC circuit, the contradiction between the area and the dynamic range and the contradiction between the resolution and the design complexity in a traditional TDC circuit are effectively solved, and various requirements on the TDC circuit of process non-controlled detection of a large-scale digital integratedcircuit based on delay measurement can be met.

Description

technical field [0001] The invention belongs to the technical field of time measurement, and in particular relates to a two-stage TDC circuit applied to process uncontrolled detection. Background technique [0002] Today, with the in-depth development of science and technology, high-precision measurement is still a frontier topic being explored in many fields. High-precision digital time converter (TDC) was first developed from the field of high-energy particle measurement, and has now been extended to many other important application fields, such as nuclear medical imaging, radar, coincidence system, fully digital phase-locked loop and laser ranging Wait. The TDC circuit in the present invention is mainly used in the detection of uncontrolled process in the integrated circuit manufacturing process. Since the manufacturer did not follow the established process steps in the integrated circuit manufacturing process, or deliberately made changes in some processes, resulting in...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G04F10/00
CPCG04F10/00
Inventor 史江义郭海孟坤马佩军吴秋纬曹仁杰鱼鲧张华春
Owner XIDIAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com