Spectrograph

A technology of spectrometer and light, which is applied in the field of spectrometer, can solve the problems of low energy utilization, no dispersion, and low measurement accuracy, and achieve the effect of high wavelength subdivision, high accuracy, and high measurement accuracy

Inactive Publication Date: 2013-06-05
HANGZHOU EVERFINE PHOTO E INFO
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  • Summary
  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

When each monochromator actually works, it outputs monochromatic light of different wavelengths by rotating the grating, which not only takes a long time; and as mentioned above, all the measured light is introduced into the monochromator at one time, and a large amount of stray light is introduced, so the measurement is accurate low degree
[0006] In addition, since the zero-order spectrum of the grating has the largest energy but cannot be dispersed, the spectrometer actually measures the first-order spectrum of the grating with dispersion, but because of its low energy, it is limited by the sensitivity of the detector, and often requires a larger energy incident light. In order to ensure that the first-order spectrum is detected by the detector, the energy utilization rate is low; but when the incident light energy increases, the energy of its zero-order spectrum and other order spectra is also greater, and there are more stray light inside the spectrometer, which affects measurement accuracy

Method used

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Embodiment 1

[0030] Such as figure 1 As shown, the present embodiment discloses a spectrometer, including a beam splitter 1, 5 bandpass color filters 3, 5 array spectrometers 2, a control center 4 and a chassis 5; the beam splitter 1, the bandpass color filter 3 and the array spectrometer 2 are both arranged in the case 5.

[0031] Beam splitter 1 is a "one-to-five" bifurcated optical fiber, including one optical input port 1-1 and five optical output ports 1-2; 380nm-460nm, 460nm-540nm, 540nm-620nm, 620nm-700nm and 700nm-780nm, the conduction bands of the above-mentioned array spectrometers 2 first overlap and cover the entire band to be measured; the conduction bands of each bandpass color filter 3 The wavelength band is slightly larger than the corresponding measurement band of the array spectrometer 2, and its pass-through bands are also sequentially 360nm-480nm, 440nm-560nm, 520nm-620nm, 620nm-700nm and 700nm-780nm. During the test, the array spectrometer 2 receives the light beams ...

Embodiment 2

[0035] Such as figure 2 As shown, different from Embodiment 1, the beam splitter 1 of this embodiment is a beam splitting half-mirror group, the light beam is input from the light output port 1-1, and the beam splitting half-mirror group includes three beam-splitting prisms , each prism has a light output port 1-2 respectively; each light output port 1-2 is respectively provided with an array spectrometer 2, and each array spectrometer 2 is provided with a band-pass color filter 3.

[0036] In this embodiment, each band-pass color filter 3 corresponds to each array spectrometer 2 one by one, and the conduction band of each band-pass color filter 3 is equal to the measurement band of its corresponding array spectrometer 2 . The wavelength band to be measured is 380nm-780nm, the measurement bands of the three array spectrometers 2 are 380nm-500nm, 500nm-620nm and 620nm-780nm respectively, and the pass-through bands of each band-pass color filter 3 are also sequentially 380nm-50...

Embodiment 3

[0039] Such as image 3 As shown, the difference from Embodiment 1 is that it includes a light mixer 6, which is an integrating sphere, and is arranged on the optical path before the light output port 1-2, and the measured light passes through the light mixer 6 to fully The light is mixed, and then filtered by each bandpass color filter 3 and then entered into the corresponding array spectrometer 2 for analysis and measurement.

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Abstract

The invention discloses a spectrograph which comprises a beam splitter and a plurality of array spectrographs. To-be-detected light is divided into a plurality of beams by the beam splitter, each wave band is measured accurately by measuring each array spectrograph, wherein the array spectrographs are connected end to end in scope and cover the whole to-be-detected wave bands, and spectral power distribution of the whole to-be-detected wave bands is obtained accurately only by one measurement. The spectrograph has the advantages of being fast in measuring speed, high in measuring accuracy, high in fine division of wavelength, high in energy utilization rate, convenient to operate and the like.

Description

technical field [0001] The invention belongs to the field of optical radiation measurement, and in particular relates to a spectrometer. Background technique [0002] The spectrometer is a device used to measure and analyze the spectral composition of the spectral radiant power distribution, and is widely used in light source radiation measurement, color measurement, element identification, chemical analysis and other fields. Commonly used spectrometers include monochromators and polychromators (multi-channel spectrometers, array fast spectrometers, etc.). Array spectrometers using multi-channel detectors have a measurement speed of milliseconds. In recent years, they have developed rapidly and their applications have become more and more extensive. [0003] The stray light index is an important index of the array spectrometer. For the array spectrometer, stray light refers to other spectral components irradiated on the pixel corresponding to a specific wavelength point, and...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28
CPCG01J3/28G01J3/0221G01J3/18G01J3/2803G01J2003/1861
Inventor 潘建根
Owner HANGZHOU EVERFINE PHOTO E INFO
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