Substance surface property parametric analysis system

A surface property and parameter analysis technology, applied in the direction of analyzing materials, measuring devices, instruments, etc., can solve problems such as no joint measurement

Active Publication Date: 2009-03-25
重庆为讯科学仪器有限责任公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the prior art, there is no device that can jointly measure the above five parameters

Method used

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  • Substance surface property parametric analysis system
  • Substance surface property parametric analysis system
  • Substance surface property parametric analysis system

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Experimental program
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Embodiment Construction

[0070] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

[0071] The material surface property parameter analysis system of this embodiment includes a sample processing device and a detection system, see figure 1 , the sample processing device includes a sample holding device 11 for containing the analyte; the sample holding device 11 also includes a liquid inlet pipe 12 and a liquid outlet pipe 13, and the liquid outlet pipe 13 communicates with the bottom of the sample holding device 11 , the liquid inlet pipe 12 communicates with the sample holding device 11 , and the liquid outlet pipe 13 is connected with a constant flow pump; the sample holding device 11 is also provided with a stirring device 15 .

[0072] see figure 2 , the detection system includes:

[0073] The ion activity detection device is used to detect the various ion activities of the solution in the sample holding device 11...

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Abstract

The invention discloses a system for analyzing material surface property parameters. The system can determine surface electric potential of materials accurately. A determining system comprises a sample processing device and a detection system, wherein the sample processing device comprises a sample accommodation device which is used for accommodating the determined materials and liquid, is also provided with a liquid inlet pipe and a liquid outlet pipe which are communicated with the sample accommodation device, wherein the liquid outlet pipe is connected with a constant flow pump, and the sample accommodation device is also provided with a stirring device; the detection system comprises an ionic activity detecting device, an ionic activity operating module and a surface parameter operating module, and the surface parameter operating module is used for receiving the ionic activity operated by the ionic activity operating module so as to work out the surface potential of the determined materials; and in a further technical proposal, total surface charge quantity, surface charge density, surface electric field intensity and specific surface area of the determined materials can be analyzed sequentially so as to realize the combined analysis of the material surface property parameter.

Description

technical field [0001] The invention relates to the technical fields of colloid chemistry, interface chemistry and material science, in particular to a device for measuring surface property parameters of substances. Background technique [0002] The surface properties of substances such as surface potential, total surface charge, surface charge density, surface electric field strength and specific surface area are not only important in scientific research in the fields of colloid and interface science, material science, life science, soil science, ecology and environmental science, etc. It is widely used in chemical engineering fields such as papermaking, cement, ceramics, chemical mechanical grinding, coal slurry, paint, cosmetics, food industry, mixed dispersion system, etc. Therefore, the determination of the surface property parameters of the above materials is particularly important. important. [0003] In the prior art, indicator ion adsorption method and potentiometr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/00G01R29/24G01R19/08G01R29/12G01N33/00
Inventor 李航朱华玲侯捷吴劳生
Owner 重庆为讯科学仪器有限责任公司
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