Object three-dimensional contour outline measuring set and measuring method

Abstract

An object three-dimensional outline measurement device and a measurement method are disclosed, the device is composed of a laser diode, a lens, an aperture diaphragm, a two-dimensional Dammam grating, a cylindrical mirror and an area array CCD camera, a transmission line and a computer, the connection relationship therebetween is as below: a beam emitted by the laser diode passes through the lens, the aperture diaphragm, the two-dimensional Dammam grating, and the cylindrical mirror sequentially to form one-dimensional projection array stripes, which illuminates the surface of an objective to be measured, the area array CCD camera collects the grating projection strips modulated by three-dimensional digital shape on the surface of the measured objective and outputs the strips to the computer via the transmission line, the computer includes an image collecting interface, image collecting software and three-dimensional measurement information reconstruction algorithm software. The invention has, by utilizing the Fourier transform three-dimensional outline measurement structure, the advantages of high energy utilization rate, simple measurement structure, high measurement precision, convenient computer reconstruction information processing and great easiness for operation.

Description

technical field [0001] The invention relates to object three-dimensional profile measurement, in particular to an object three-dimensional profile measurement device and a measurement method. Background technique [0002] Optical three-dimensional shape measurement technology is widely used in various measurement fields, and has the advantages of high precision, fast speed and non-contact measurement. At present, the optical three-dimensional shape measurement technology mainly adopts the principle of active optical three-dimensional measurement, which makes the illumination light field structured (points, lines, grating stripes, etc.), and uses structured light to illuminate the measured object. Modulation is performed so that the light field distribution on the surface of the object carries the three-dimensional shape information of the surface of the object to be measured. The image of the modulated structured light field is captured by a CCD camera, processed by a compu...

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Problems solved by technology

[0010] The present invention will solve the inhomogeneity, low energy utilization rate and line compression ratio of the one-dimensional projection array fringe produced by sinusoidal amplitude grating, binary amplitude type grating or digital projector in the measurement structure of Fourier transform profilometry in the above-mentioned prior art For small and other problems, provide a three-dimensional contour measurement device and measurement method of an object, the device has the characteristics of high measurement accuracy, simple measurement device, simple computer reconstruction information processing and easy operation

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