High-temperature heating equipment used for orientation texture measurement

Abstract

The invention relates to a high-temperature heating device for measuring the orientation texture in a measurement technical field, comprising a heating furnace, a heating element, a sample stage, a sample rack, a thermocouple, a water cooling pipe, a step motor, wherein the exterior of the heating furnace is a ceramics socket sleeve and a spiral drum type heating element is embedded into the heating furnace and the heating furnace is set on the sample stage; and the sample rack is set in the step motor and separated from the heating furnace, capable of rotating along the self-axle in the heating furnace; a water cooling pipe is set at the lower part of the sample rack and coils in parallel with the sample undersurface to form a cooling plane; and the thermocouple is set in the heating furnace. During heating process, the sample can rotate and the uniform heating of sample can be ensured; at the same time the rotation is consistent with the Phi rotation in general texture measurement, thereby ensuring the texture measurement at high-temperature; in addition, the whole of the heating furnace is set on the texture measurement stage, thus Psi rotation of stress rolling method, therefore the high-temperature stress measurement can be performed.

Description

technical field [0001] The invention relates to a device in the field of measurement technology, in particular to a high-temperature heating device for measuring orientation texture. Background technique [0002] X-ray diffraction (XRD) is one of the basic means to characterize the material structure. In addition to conventional crystal structure analysis, it can also perform qualitative and quantitative analysis of crystal orientation and texture. The so-called "texture" refers to the concentrated distribution of crystal orientations of many crystal grains appearing in one or some specific spatial directions in polycrystals. Different from the Bragg diffraction cone formed by the general powder sample in space, the diffraction signal of the textured sample usually forms some spots in a specific direction in space, which requires the sample to not only be able to perform θ-2θ rotation, but also to rotate around the vertical surface of the sample. The axis undergoes a φ rota...

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Problems solved by technology

[0005] After searching the literature of the existing technology, it was found that the Chinese utility model patent "XRD sample stage device for both orientation and non-orientation crystal analysis" (patent number: ZL200620079376.7), specifically: retain the main body of the sample stage for routine testing of the X-ray diffractometer , on one side of the same base, a rotation orientation device suitable for the measurement of orientation samples is added, and its disadvantage is that the x-rotation and high-temperature measurement cannot be completed

Qunli Rao and others published the paper "The orientation characterization of single crystal superconductor film with 2-dimensional x- ray diffraction” (two-dimensional X-ray diffraction of single-crystal superconducting thin film for direction characterization) uses Bruker’s two-position x goniometer to complete the measurement of the orientation pole figure. The disadvantage is that the measurement at high temperature cannot be completed without a heating device

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