Pentaprism combination ultralong focal-length measurement method and apparatus
A measurement method and measurement device technology, applied in the direction of testing optical properties, etc., to achieve the effect of improving resolution, improving sensitivity, and low cost
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2009-07-29
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention belongs to the technical field of optical precision measurement and can be used for the detection of ultra-long focal length lenses and the high-precision focal length measurement in the assembly process of optical systems. technical background
[0002] In recent years, ultra-long focal length lenses have been widely used in large-scale optical systems such as high-energy lasers and astronomical telescopes. The processing, testing and assembly of such large-scale lenses are very difficult. As an important parameter of ultra-long focal length lenses, its focal length measurement has always been a difficult point in the field of optical measurement. The main factors are: long focal depth, difficult to achieve accurate focusing; long focal length, difficult to measure length precisely; long optical path, measurement is easily affected by environmental interference .
[0003] Due to the influence of the above factors, it is difficult for the...
Examples
Embodiment
[0043] Such as figure 2 Shown, a kind of pentaprism combined ultra-long focal length measurement method, its measurement steps are:
[0044] (a) Use a near-infrared 1064 μm laser to irradiate a slit as the alignment target 9. After the outgoing light is converged by the reference lens 5 and refracted by the pentaprism 2, it is imaged on the CCD detector 11 through the collimator 12. At this time, the translation stage 13 drives the alignment target 9 to scan and move in the direction of the optical axis of the reference lens 5, and when it moves to a new scanning position, it judges whether it coincides with the second focus position 8 by translating the pentaprism 2.
[0045] The judgment method is as follows: Figure 4 As shown, when there is a defocus amount 18 between the scanning position where the slit is aligned with the target 9 and the second focus position 8, the translation stage 17 drives the pentaprism 2 to translate in the direction of the CCD detector 11, and th...